Testing assembly including a multiple degree of freedom stage

ABSTRACT

A multiple degree of freedom sample stage or testing assembly including a multiple degree of freedom sample stage. The multiple degree of freedom sample stage includes a plurality of stages including linear, and one or more of rotation or tilt stages configured to position a sample in a plurality of orientations for access or observation by multiple instruments in a clustered volume that confines movement of the multiple degree of freedom sample stage. The multiple degree of freedom sample stage includes one or more clamping assemblies to statically hold the sample in place throughout observation and with the application of force to the sample, for instance by a mechanical testing instrument. Further, the multiple degree of freedom sample stage includes one or more cross roller bearing assemblies that substantially eliminate mechanical tolerance between elements of one or more stages in directions orthogonal to a moving axis of the respective stages.

RELATED APPLICATIONS

This application is a continuation application of U.S. application Ser.No. 14/347,173, filed Mar. 25, 2014, which application is a U.S.National Stage Application under 35 U.S.C. 371 from InternationalApplication Serial No. PCT/US2012/058019, filed Sep. 28, 2012, whichpatent application claims the benefit of priority to U.S. ProvisionalPatent Application Ser. No. 61/540,317, filed on Sep. 28, 2011, whichare all incorporated herein by reference in their entireties.

TECHNICAL FIELD

This document pertains generally, but not by way of limitation, toassemblies for and methods of mechanically testing samples at a micronor lower scale.

BACKGROUND

Instrument housing chambers, for instance, a chamber of a scanningelectron microscope (SEM), optical microscope, transmission electronmicroscope or other multi-instrument assembly contains a plurality ofinstruments and detectors tightly clustered around and directed toward acentralized location near a sample stage. The centralized location issmall and limits access to the sample, for instance by mechanicaltesting instruments installed within the chamber.

In one example, a mechanical testing instrument is installed within anaccess orifice of the instrument housing chamber. The mechanical testinginstrument is affirmatively coupled with the instrument housing wall andextends from the wall toward the centralized location in a limited orsingle orientation (e.g., at static installation angle relative to thesample stage). The mechanical testing instrument extending from the wallto the centralized location consumes valuable space in the instrumenthousing chamber. A sample in the instrument housing chamber must beoriented toward the instrument to facilitate mechanical testing. Forinstance, the sample stage must orient the sample at an anglecomplementary to the installation angle. Because the installation anglerelative to the sample stage is acute, obtuse or the like it isdifficult to accurately position the sample for mechanical testingwithout time consuming and difficult actuation of the sample stage intoawkward orientations. Moreover, the orientation of the sample may be ata less than ideal angle (e.g., non-orthogonal) and frustrate theaccuracy of mechanical testing through indentation or scratching.Further still, the extension of the mechanical testing instrument fromthe wall consumes valuable space otherwise available for instruments,electronics and the like within the instrument housing chamber.Moreover, decoupling of the sample from the mechanical test instrumentcreates a large mechanical loop that extends through the instrumenthousing wall which may add to uncertainty and error during quantitativemechanical testing.

In another example, a testing assembly including a mechanical testinginstrument and a stage is coupled with the sample stage of theinstrument housing chamber. The stages of these testing assembliesprovide limited (e.g., linear) orientation of the sample relative to themechanical testing instrument and the cluster of instruments anddetectors of the instrument chamber housing. The orientation flexibilityof the sample is limited by the compact chamber of the instrumenthousing as well as the instruments and detectors clustered around thecentralized location of the instrument housing sample stage. Further,mechanical testing may be performed and then the sample must bereoriented for examination or further work by the instruments anddetectors of the instrument chamber housing.

Additionally, the provision of linear stages adds tolerance to the stagecarrying the sample and correspondingly frustrates the accuratepositioning of the sample including micron or smaller testing locationsof interest relative to instruments. Tolerance is required to facilitatemotion between portions of the stages, and with each degree of freedomthe tolerance of the stage is compounded. Moreover, through mechanicaltesting the sample and the stage experience forces, moments and the likethat can undesirably move the sample because of tolerances and furtherfrustrate the accuracy of measurements and the observation of a micronor smaller testing location of interest.

OVERVIEW

The inventors have recognized, among other things, that a problem to besolved can include the positioning of a sample for observation andmechanical interaction and testing within a compact chamber of aninstrument housing, such as a scanning electron microscope (SEM). Thechamber of such an instrument housing includes a series of instrumentsand detectors (e.g., FIB instruments, one or more electron back scatterdetectors (EBSD), an electron gun for an SEM and the like) clusteredaround a centralized testing location as well as the physical boundariesof the instrument housing walls. To make full use of all or a subset ofthe instruments and detectors within the instrument housing a samplemust be oriented and positioned within the compact chamber according tothe testing parameters of the instruments and detectors (e.g., focalpoints, working distances, and cooperative positioning needs of two ormore instruments such as an electron gun and an EBSD). The orientationand position of the sample for each instrument and detector must bewithin the centralized location and not result in impingement orcollision of the sample or a stage with any of the clustered instrumentsor detectors surrounding the centralized testing location (e.g., alocalized coincidence region including a plurality of working regions ofone or more instruments).

In an example, the present subject matter can provide a solution to thisproblem, such as by the provision of a testing assembly incorporating amultiple degree of freedom sample stage. In one example, the testingassembly is coupled with the existing sample stage of the instrumenthousing (e.g., the sample stage of an SEM). The testing assembly uses amultiple degree of freedom sample stage including linear, rotation andtilt stages to accurately, reliably and quickly position and repositiona sample within the chamber according to the testing parameters (e.g.,working regions, such as focal points, instrument ranges and the like)of each of the instruments used successively or at the same time.Further, the positioning and orienting of the sample occurs within thecentralized location (localized coincidence region) of the compactchamber surrounded by the clustered instruments and the detectors. Thecombination of rotation, tilt and linear positioning facilitates theorienting and positioning of a sample at the centralized locationaccording to the working regions of the one or more instruments.Moreover, the positioning and repositioning of the sample is performedwithout opening of the chamber and manual repositioning.

In another example, the testing assembly includes one or more stagescoupled with a mechanical testing instrument (e.g., a transducerincluding an indentation or scratch probe, tensile grips or the like) toprovide at least one additional degree of freedom to the testingassembly. For instance, a sample that is tilted and rotated to directthe sample toward a first instrument is retained in close proximity tothe centralized location of the compact chamber defined by the focalpoints or working distances (e.g., the working regions) of the one ormore instruments and detectors as well as their physical housings. Themechanical testing instrument is similarly positionable relative to thesample to mechanically test the sample. The testing assembly therebypositions and orients the sample according to the parameters of each ofthe instruments originally present within the compact chamber of theinstrument housing while at the same time positioning a mechanicaltesting instrument to interact with the sample. Moving the mechanicaltesting instrument maintains the sample in the desired orientation ofthe instruments and detectors, allows for their use and also allows forcontemporaneous mechanical testing of the sample.

As described herein, the multiple degree of freedom sample stage (and insome examples the mechanical testing instrument) allows for thepositioning and orienting of a sample within a centralized location(e.g., localized coincidence region) of the compact chamber andsubstantially prevents impingement or collision of the multiple degreeof freedom sample stage with the instruments and detectors tightlyclustered around the centralized location.

Another problem to be solved can include the tolerance of the variousstages used to position and orient a sample within the centralizedlocation of the instrument housing. Because the instruments, detectorsand the mechanical testing instrument test at micron or smallerlocations on the sample even minor tolerance in the stages can move asample location of interest out of alignment for testing or observation.When compounded with multiple stages providing multiple degrees offreedom, the tolerance of each of the stages can further enhance theinaccuracy of the sample location positioning and orientation.Furthermore, mechanical testing of the sample by indenting, scratchingand the like can impermissibly move the sample out of alignment with oneor more of the instruments or detectors because of tolerance in thestages or a failure to affirmatively lock one or more of the stages inplace prior to mechanical testing. Excessive compliance in the stagesadds to uncertainty in mechanical measurements and further frustratesthe ability to extract quantitative mechanical data from the testing.

In another example, the disclosed subject matter can provide a solutionto this problem, such as by the provision of cross roller bearingassemblies for one or more linear stages that provide a solid structuralinterface between each stage and stage base. The surface to surfaceengagement between the cylindrical bearing surfaces and the opposedinterface surfaces substantially eliminates relative movement of thecomponents of each linear stage along axes not coincident with thelinear axes of the respective stages. Additionally, one or more of therotation and tilt stages includes clamping assemblies that affirmativelyhold the stage of each actuator static relative to the respective stagebase. The clamping assemblies bias the stage into engagement with thestage base with multiple points of contact to tightly hold the stage inthe desired position. Even with engagement by the mechanical testinginstrument with the sample (e.g., indenting, scratching and the like)and corresponding transmission of forces to the multiple degree offreedom sample stage, the sample is reliably held in the desiredposition and orientation for testing and observation. The multipledegree of freedom stage is thereby able to provide the flexibility ofthe linear, tilt and rotation positioning without the compoundedtolerances provided in other multiple degree of freedom assemblies.

This overview is intended to provide an overview of subject matter ofthe disclosure. It is not intended to provide an exclusive or exhaustiveexplanation of the disclosure. The detailed description is included toprovide further information about the disclosure.

BRIEF DESCRIPTION OF THE DRAWINGS

In the drawings, which are not necessarily drawn to scale, like numeralsmay describe similar components in different views. The drawingsillustrate generally, by way of example, but not by way of limitation,various embodiments of the disclosure.

FIG. 1 is an isometric cutaway view of one example of a multi-instrumentassembly including a multiple degree of freedom sample stage.

FIG. 2 is an isometric view of a testing assembly that includes themultiple degree of freedom sample stage shown in FIG. 1 with a samplestage surface in a first orientation.

FIG. 3 is a detailed isometric view of the multiple degree of freedomsample stage shown in FIG. 1.

FIG. 4 is an isometric view of one example of mechanical testinginstrument coupled with the testing assembly.

FIG. 5 is a bottom isometric view of the testing assembly of FIG. 2including one example of an assembly mount.

FIG. 6 is a schematic view of the testing assembly of FIG. 2 includingmultiple linear stages, a rotation stage and a tilt stage.

FIG. 7 is a cross sectional view of one example a cross roller bearingassembly interposed between a stage and a stage base.

FIG. 8A is an isometric view of one example of an assembly includingrotation and tilt stages.

FIG. 8B is a cross sectional view of the assembly of the rotation andtilt stages shown in FIG. 8A.

FIG. 9 is an isometric view of piezo motors and a clamping assembly ofthe rotation stage shown in FIG. 8A.

FIG. 10A is an isometric view of piezo motors and a clamping assembly ofthe tilt stage shown in FIG. 8A.

FIG. 10B is a cross sectional view of the tilt stage of FIG. 8A showinga plurality of actuator shoes providing two or more points of contactbetween the stage base and the stage of the tilt stage.

FIG. 11 is an isometric view of another example of a testing assemblythat includes a stage coupled with a mechanical testing instrument.

FIG. 12 is an isometric view of the stage shown in FIG. 11.

FIG. 13A is an isometric view of the testing assembly of FIG. 2 with asample stage surface in a second orientation.

FIG. 13B is a schematic view of the testing assembly in FIG. 13A in thesecond orientation.

FIG. 14 is a schematic view of an example of the multiple degree offreedom sample stage including force vectors applied and transmittedthrough the sample stage.

FIG. 15 is a block diagram showing one example of a method for orientinga sample within a chamber of a multi-instrument assembly using themultiple degree of freedom sample stage assembly.

FIG. 16 is a block diagram showing one example of a method for locking astage of a sample stage assembly in an orientation.

FIG. 17 is a block diagram showing one example of a method for using amultiple degree of freedom sample stage including a plurality of linearstages.

DETAILED DESCRIPTION

FIG. 1 shows a partial cutaway view of a multi-instrument assembly 100.As shown, the multi-instrument assembly 100 includes a microscopechamber 102 surrounding a testing assembly 112 and a plurality ofinstruments including first, second, third, and fourth instruments 104,106, 108, 110. As shown, each of the first through fourth instruments104-110 is tightly clustered around an area adjacent to the testingassembly 112. For instance, the first through fourth instruments 104-110are arranged and include instrument axis and focal points or workingdistances (e.g., working regions) defining or within a localizedcoincidence region near the testing assembly 112, for instance, adjacentto a multiple degree of freedom sample stage 116. As will be describedin further detail below, the multiple degree of freedom sample stage116, a component of the testing assembly 112, is configured to orient asample on a sample stage surface into a plurality of orientationsrelative to two or more of the instruments of the first through fourthinstruments 104-110.

As shown in FIG. 1, the testing assembly 112 is positioned within themicroscope chamber 102, as previously described herein. As shown, thetesting assembly 112 includes a mechanical testing instrument 114 suchas an indenter, a scratch (laterally moving) mechanical testinginstrument, tensile testing instrument, and the like. The mechanicaltesting instrument 114 is configured to interact with a sample presenton a sample surface stage of the multiple degree of freedom sample stage116. The multiple degree of freedom sample stage 116 coupled with thetesting assembly 112 provides multiple degrees of freedom to positionand orient the sample on the sample surface stage relative to one ormore of the first through fourth instruments 104-110 and the mechanicaltesting instrument 114. For instance, the multiple degree of freedom andsample stage 116 is configured to position a sample for interaction withthe mechanical testing instrument 114 while at the same time allowingfor observation and further manipulation by one or more of the firstthrough fourth instruments, 104-110. Stated another way, the multipledegree of freedom sample stage facilitates the mechanical testing of asample on the sample stage surface while at the same time (orcontemporaneously) the sample is observed or manipulated by one or moreof the first through fourth instruments, 104-110. In a similar manner,the multiple degree of freedom sample stage 116 allows for thepositioning and orientation of the sample within the compact volume ofthe localized coincidence region formed by each of the first throughfourth instruments, 104-110. As will be described in further detailherein, the multiple degree of freedom sample stage 116 allows for thepositioning and orientation of the sample within this tight clusteredarea within the microscope chamber 102 without interaction or collisionwith any of the first through fourth instruments 104-110. Stated anotherway, the multiple degree of freedom sample stage 116 is configured toorient the sample stage surface (e.g., one or more of the sample, thesample stage surface, or a portion of the sample stage surface) to eachof the working regions in the localized coincidence region through acombination of movement of two or more of the plurality of linear,rotation and tilt stages.

In one example the multi-instrument assembly 100 includes a microscopeinstrument such as a scanning electron microscope including, forinstance, a first instrument 104 such as an electron gun and a secondinstrument 108 such as an electron back scatter detector. In anotheroption, the multi-instrument assembly 100 includes a third instrument110 such as a secondary electron detector and a fourth instrument 106such as a focused ion beam gun. In one example, the fourth instrument106 is a tool configured to further process the sample positioned on thesample stage surface. For instance, the fourth instrument 106, in oneexample a focused ion beam gun, is configured to remove portions of thesample and expose previously unavailable portions of the sample forfurther study and interaction with the mechanical testing instrument 114and one or more of the first through third instruments 104-108.

Overview of the Testing Assembly

FIG. 2 shows one example of the testing assembly 112 previously shown inFIG. 1. As previously described, the testing assembly 112 includes amechanical testing instrument 114 in one example. The testing assembly112 further includes a multiple degree freedom sample stage 116.Referring now to FIG. 2, the testing assembly 112 includes a testingassembly platform 200 sized and shaped to receive and mount each of themechanical testing instrument 114 and the multiple degree of freedomsample stage 116. The testing assembly platform 200 further includes anassembly mount 202. The assembly mount 202 in one example is configuredfor positioning with and engagement to a mounting stage 101 of themulti-instrument assembly 100 (see FIG. 1). The assembly mount 202allows for the actuation of the testing assembly relative to theinstruments 104-110 of the multi-instrument assembly 100. Further, themultiple degree of freedom sample stage 116 provides additionalorientation and positioning ability for a sample positioned on thesample stage surface of the multiple degree of freedom sample stage 116.

Referring again to FIG. 2, the multiple degree of freedom sample stage116 includes, in the example shown, a linear stage assembly 204. In oneexample, the linear stage assembly includes X, Y, and Z linear stagesconfigured to position the sample stage surface 208 along one or more ofthe linear axes. Additionally, the multiple degree of freedom samplestage 116 includes a rotation and tilt stage assembly 206 coupled withthe linear stage assembly 204. In one example, the rotation and tiltstage assembly 206 is coupled in series with the linear stage assembly204. In another example, one or more of the rotation and tilt stages isinterposed between one or more of the linear stages of the linear stageassembly 204.

In yet another example, the mechanical testing instrument 114 is coupledwith the testing assembly platform 200 with a mechanical testinginstrument linear stage 210 (e.g., a stage configured to move theinstrument relatively along an X axis) interposed therebetween. In oneexample, the mechanical testing instrument linear stage 210 includes oneor more linear stages (one or more of X, Y or Z linear stages)configured to move the mechanical testing instrument 114 relative to thesample stage surface 208 as well as one or more of the first throughfourth instruments 104-110.

As further shown in FIG. 2, actuation and sensing cabling 212 extends toone or more portions of the testing assembly 112, for instance to eachof the linear stages of the linear stage assembly 204 as well as each ofthe rotation and tilt stages of the rotation and tilt stage assembly206. Additionally, in another example actuation and sensing cabling 212is provided for the mechanical testing instrument 114, as well as themechanical testing instrument linear stage 210. The actuation andsensing cabling 212 facilitates the actuation of each of the linear,rotation and tilt stages, the mechanical testing instrument, and thelike. In another example, the actuation and sensing cabling 212 iscoupled with encoders provided with each of the stages of the linearstage assembly 204, the rotation and tilt stage assembly 206, and themechanical testing instrument linear stage 210 to facilitate theaccurate actuation and positioning and orientation measurement of theinstruments and sample stage surface 208 as described herein.

Referring again to FIG. 2, each of the instruments 104, 110 is shownwith respective first instrument and second instrument axes 214, 216. Inone example, each of the instruments includes first and second focalpoints 218, 220, respectively. In one example, the focal points includeworking distances, for instance a range of distances from the first andsecond instruments 104, 110. The instrument axes and focal points214-220 described herein are exemplary. Additionally, the instrumentsdescribed and shown in FIG. 1, for instance the second instrument 106and third instrument 108 include corresponding instrument axes and focalpoints. In one example, the instrument axes and focal points defineworking regions that correspondingly form a localized coincidence region222 in a tightly clustered position between each of the instruments104-110 according to the consolidated or composite of the workingregions. The coincidence region 222 provides a volume within themicroscope chamber 102 within which the sample stage surface 208including a sample thereon must be positioned within to provide accessand utility for each of the instruments 104-110 as well as themechanical testing instrument 114. Stated another way, the multipledegree of freedom sample stage 116 includes rotational, tilting, andlinear degrees of freedom to position the sample stage surface 208 insubstantially any desired orientation within the coincidence region 222to provide access for observation and interaction with one or more ofthe instruments 104-110 and the mechanical testing instrument 114.

Further, the multiple degree of freedom sample stage 116 is configuredto position the sample stage surface 208 within the coincidence region222 without undesired collision with any of the instruments 104-110 andthe mechanical testing instrument 114. Optionally, the mechanicaltesting instrument 114 on the mechanical testing instrument linear stage210 is configured to cooperate with movement of the multiple degree offreedom sample stage 116 to ensure mechanical testing interaction ispossible with the sample stage surface 208 in a variety of orientationsthat also align the sample with one or more the instruments 104-110. Forinstance, a sample is aligned with the mechanical testing instrument 114while the sample is also oriented relative to one or more of theinstruments 104-110.

Linear Stages of the Linear Stage Assembly

FIG. 3 shows a perspective view of the linear stage assembly 204. In theexample shown in FIG. 3, the linear stage assembly 204 includes an Xaxis linear stage 300, a Y axis linear stage 302, and a Z axis linearstage 304. As described herein, each of the linear stages includes astage base and a stage platform. In one example, the stage base isconsidered the base portion of each of the linear stages and the stageplatform is the portion moved relative to the stage base. For instance,with regard to the Y axis linear stage 302, the Y axis linear stageincludes a stage base 308A and a moveable stage platform 308B coupledwith the stage base 308A. In another example, the X axis linear stage300 includes a stage base 310A and a movable stage platform 310B movablerelative to the stage base 310A. Similarly, the Z axis linear stage 304includes a stage platform 312B movable relative to a stage base 312A. Asshown in FIG. 3, one or more of the stage bases 308A, 310B, and 312B isin some examples part of a stage platform 308B, 310B, 312B of one of theother linear stages 300-304. Stated another way, the stage platform orstage base of one of the linear stages is in at least some examples aportion, for instance an integral or coupled portion, of the other stagebases or stage platforms of the other linear stages 300-304. The linearstages 300-304 are thereby provided in series to provide X, Y, and Zmovability of the sample stage surface 208.

As shown in the example in FIG. 3, the linear stage assembly 204 iscoupled with the rotation and tilt stage assembly 206. In one example,the X, Y, and Z axes linear stages 300, 302, 304 are configured toorient and position the sample stage surface 208, including the rotationand tilt stage assembly 206. In another example, the X, Y and Z axeslinear stages 300, 302, 304 (and 210) include, but are not limited to,one or more linear stages manufactured and sold by Physik InstrumenteGmbH & CO. of Germany; Dynamic Structures and Materials, LLC ofFranklin, Tenn.; Attocube Systems AG of Germany; SmarAct GmbH ofGermany; and PiezoSystem Jena GmbH of Germany. The linear stages 300,302, 304 include actuators 301 (Shown in FIG. 3 with stage 300 andstages 302, 304 include duplicate or similar actuators 301) that movethe stage platforms relative to the respective stage bases and include,but are not limited to, linear drive stages having stepper motors, piezomotors, voice coil actuators, stick-slip actuators and the like. Oneexample of a motor usable with one or more of the linear stages 300,302, 304 is a linear motor provided by Dynamic Structures and Materials,LLC having model number I-30.

Optionally, the linear stages 300, 302, 304 are configured to provideprecise linear movement along a desired axis (e.g., the X, Y or Z axis),and as described herein otherwise constrain lateral movement of thestage platforms 308B, 310B, 312B relative to the respective stage bases308A, 310A, 312A and the corresponding linear axes. For instance, asdescribed herein, cross roller bearing assemblies (shown in FIG. 7)provide surface to surface contact by way of crossed roller bearings.The surface to surface contact constrains lateral motion of theplatforms relative to the bases (e.g., provides a minimal tolerance thatallows for linear motion but substantially prevents lateral movement).Stated another way, the cross roller bearing assemblies provide rigidstructural support through surface-to-surface contact between each ofthe stage platforms and stage bases. The cross roller bearing assembliesprovide a stiff supportive structure between the stage platforms and thestage bases to substantially prevent movement of the stage platformsrelative to the stage bases in any axis except along the linear axis ofthe stages 300, 302, 304. In other examples, the linear stages includeother bearing assemblies, including, but not limited to ball bearings,sliding bearings and the like.

In another example, the linear stages 300, 302, 304 include one or moreclamping or locking features that lock (e.g., anchor, hold, retain andthe like) the stage platforms 308B, 310B, 312B relative to therespective stage bases 308A, 310A, 312A in an unpowered configuration.That is to say, one or more of the linear stages 300, 302, 304 anchorsthe respective stage platform 308B, 310B or 312B relative to therespective stage base 308A, 310A or 312A when the actuator of the stageis not operated. The clamping or locking feature cooperates with thebearing assemblies (e.g., cross roller bearing assemblies) to provideindividual stages that are structurally stable along each axis (X, Y andZ) while static, and capable of precise linear movement with stageplatforms 308B, 310B, 312B that are constrained from moving laterally(e.g., substantially prevented from lateral movement). The linear stages300, 302, 304 in combination thereby provide a linear stage assembly 204that allows movement along each of the linear axes (X, Y and Z axes)that also minimizes tolerance between the stage platforms and bases. Thelateral constraint provided in each of the linear stages, for instanceby the cross roller bearing assemblies in combination with the clampingor locking features of one or more of the linear stages 300, 302, 304accordingly ensures the linear stage assembly 204 is stable and supportsthe sample stage surface 208 in any desired static orientation formechanical testing.

Mechanical Testing Instrument

FIG. 4 shows the mechanical testing instrument 114 previously shown inFIG. 1. As shown, the mechanical testing instrument 114 includes aninstrument housing 400 including therein transducers, sensors and thelike configured for operation and sensing of movement of the instrumentshaft 406 and an instrument tip 408 at the end of the instrument shaft406. As described herein, the mechanical testing instrument 114 isconfigured to engage with and test (e.g., indent, scratch, providetensile force through grip features and the like) a sample present onthe sample stage surface 206 coupled with the multiple degree of freedomsample stage 116. In another example, the mechanical testing instrument114 includes a three dimensional transducer configured to provide one ormore of indentation, scratching and the like of the instrument tip 408over the sample present on the sample stage surface 208.

In one example, the mechanical testing instrument 114 includes a modulardesign. For instance the mechanical testing instrument 114 includes aninstrument interface 402 sized and shaped for corresponding engagementwith a complementary electromechanical interface 404. In one example,the electromechanical interface 404 is coupled with a portion of themechanical testing instrument linear stage 210. The electromechanicalinterface 404 provides a mechanical interface for the structuralcomponents of the mechanical testing instrument 114 and at the same timeprovides an electrical interface for the transducer and any otherinstruments, sensors, or detectors of the mechanical testing instrument114. In another example, the electromechanical interface 404 providesmechanical and electrical connections with any of a number ofinstruments configured for modular connection with the electromechanicalinterface 404 for instance at an instrument interface 402 of therespective instruments. For instance, the mechanical testing instrument114 includes, but is not limited to an array of separate instrumentssuch as an indenter, a scanner, a detector, and the like. Each of theinstruments is configured for one or more of mechanical engagement andtesting with the sample present on the sample stage surface 208 and/orobservation and scanning or detection of features and characteristics ofthe sample present on the sample stage surface 208.

Referring again to FIG. 4, the mechanical testing instrument linearstage 210 (e.g., a linear X stage) is shown coupling the mechanicaltesting instrument 114 (including for instance the electromechanicalinterface 404) with the testing assembly platform 200. As describedherein, the mechanical testing instrument linear stage 210 provides forat least linear movement of the mechanical testing instrument 114,relative to the multiple degree of freedom sample stage 116 including,for instance, a sample present on the sample stage surface 208.

The Testing Assembly Mount

FIG. 5 shows another view of the testing assembly 112 including thetesting assembly platform 200. In the view shown in FIG. 5, a bottomportion of the testing assembly 112 is provided. As previouslydescribed, in one example the testing assembly 112 includes an assemblymount 202 provided on a portion of the testing assembly platform 200. Asshown in FIG. 5, the assembly mount 202 extends from the testingassembly platform 200 and is configured for cooperative engagement witha mounting stage 101 of the multi-instrument assembly 100. In oneexample, the assembly mount 202 includes a mount perimeter 500. Themount perimeter 500 is sized and shaped for complementary engagement(e.g., reception) within a corresponding orifice of the mounting stage101 of the multi-instrument microscope 100. For instance, the mountperimeter 500 is non-circular and complementary to the mounting stageorifice of the multi-instrument assembly 100. The non-circular perimeterensures the testing assembly platform 200 is non-rotatably coupled withthe mounting stage 101 of the multi-instrument assembly 100. Further,the non-circular perimeter 500 of the assembly mount 202 ensures thatmovement of the testing assembly 112, for instance, provided by themounting stage 101 of the multi-instrument assembly 100 is accuratelyand reliably transmitted to the testing assembly platform 200 (forinstance by avoiding relative rotation between a circular orifice and acircular mount). Accordingly, a multi-instrument assembly 100 configuredto actuate a mounting stage 101 is thereby able to provide furtherflexibility of orientation (e.g., one or more of linear, rotational andtilting) in addition to multiple degrees of freedom provided by thetesting assembly 112, as described herein.

In another example, the assembly mount 202 includes a platform couplingfeature 502 such as a dovetail extending along at least one of thesurfaces of the assembly mount 202. In one example, the platformcoupling feature 502 is sized and shaped for complementary engagementwith a corresponding feature of the mounting stage 101 of themulti-instrument assembly 100. The platform coupling feature 502affirmatively engages the testing assembly 112 with the multi-instrumentassembly 100 (e.g., when mounted) to thereby provide a solid structuralsupport rigidly coupled with the assembly 100.

Schematic Representation of the Multiple Degrees of Freedom for theTesting Assembly

FIG. 6 shows a schematic representation of the testing assembly 112including, for instance, the mechanical testing instrument 114 and themultiple degree of freedom sample stage 116. As previously described,each of the multiple degree of freedom sample stage 116 and the optionalmechanical testing instrument 114 are coupled with a testing assemblyplatform 200 and thereby form a unitary design configured for couplingwith a mounting stage 101 of a multi-instrument assembly, such as theassembly 100 shown in FIG. 1.

The schematic representation in FIG. 6 shows each of the degrees offreedom of movement of the testing assembly 112 including the degrees offreedom for the sample stage surface 208 as well as the mechanicaltesting instrument 114 (including the instrument shaft 406 and theinstrument tip 408). As described herein, the multiple degrees offreedom for both the multiple degree of freedom sample stage 116 and themechanical testing instrument 114 in combination with the stage provideenhanced flexibility for the positioning and orienting of the sample onthe sample stage surface 208 relative to one or more instruments such asthe instruments 104-110 and the mechanical testing instrument 114 shownin FIG. 1. Stated another way, with the compact form factor of thetesting assembly 112, a sample is capable of being positioned andoriented relative to one or more instruments in a plurality oforientations to provide access and interactivity with the instrumentsalong with in situ testing with the mechanical testing instrument 114despite the tight clustered nature of the instruments 104-110 withoutrequiring manual repositioning of the sample relative to the desiredinstruments.

Referring again to FIG. 6, a rotation stage 600 is shown coupled withthe linear stage assembly 204. In one example, the rotation stage 600 iscoupled in series with the linear stage assembly 204. In anotherexample, the rotation stage 600 is coupled between one or more of the X,Y or Z axis linear stages 300-304. In a similar manner, a tilt stage 602is coupled with the rotation stage 600. The tilt stage 602 is showncoupled in series with the rotation stage 600. In another example, thetilt stage 602, similarly to the rotation stage 600, may be interposedbetween one or more of the rotation stage 600 and a linear stage such asthe X, Y or Z axis linear stages 300-304. Optionally, the tilt stage 602is positionable between any of the linear stages 300-304. In stillanother example, any one of the rotation and tilt stages 600, 602 ispositionable between the testing assembly platform 200 and one or moreof the linear stages 300-304.

Referring first to the rotation stage 600, the rotation stage 600includes a stage base 604A coupled with the stage 312B of the Z axislinear stage 304. Additionally, the rotation stage 600 includes a stageplatform 604B movably coupled with the stage base 604A. The stageplatform 604B is rotatable relative to the stage base 604A according tothe actuation of one more actuators described later herein.

Referring again to FIG. 6, the tilt stage 602 is shown with acorresponding stage base 606A and stage platform 606B. In one example,the stage platform 606B is coupled with the sample stage surface 208.The stage platform 606B is tiltable relative to the stage base 606A, andin one example the stage platform 606B, including the sample stagesurface 208 coupled thereon, is configured for movement, for instance,over an arc of 180 degrees from the position shown in FIG. 6. Statedanother way, the sample stage surface 208 and the stage platform 606Bare positionable in an orientation opposed to the orientation shown inFIG. 6. In another example, the rotation stage 600 is rotatable over anarc of approximately 180 degrees thereby allowing for positioning of thesample stage surface 208 in substantially any orientation along the 360degree circuit of the rotation stage 600. The rotation stage 600 and thetilt stage 602 when operated in combination allow for the positioning ofsample stage surface 208 along a full 360 degree circuit around thecenter axis of the rotation stage 600.

Optionally, the multiple degree of freedom sample stage includes asample rotational stage 610 interposed between the sample stage surface208 and the tilt stage 602. In one example, the sample rotational stage610 includes a stage base 612A and a stage platform 612B. The stage base612A is in one example coupled with the stage platform 606B of the tiltstage 602, and the stage platform 612B is coupled with the sample stagesurface 208. The sample rotation stage 610 is operable to rotate thesample stage surface 208 and a sample thereon around a sample surfacerotation axis 614 (shown in FIG. 6). Rotation provided by the samplerotation stage 610 facilitates the positioning and alignment of a sample(e.g., a heterogenous sample, sample with multiple testing locations andthe like) with one or more instruments, as described herein. The samplerotation stage 610 provides an additional degree of freedom to thetesting assembly 112, for instance a sixth degree of freedom incombination with the rotation and tilt stages 600, 602 and the linearstages 300, 302, 304.

The sample rotation stage 610 in another example, is configuredsimilarly to the rotation or tilt stages 600, 602 described in detailherein. For instance, the sample rotation stage 610 includes one or moremotors, such as piezo motors that operate to rotate the stage platform612B and the sample stage surface 208. In another example and similarlyto the rotation or tilt stages 600, 602, while the sample rotation stage610 is relaxed (e.g., the motor is not operated), the stage 610 operatesto clamp the stage platform 612B in place to stably and reliablyposition the sample thereon for mechanical testing using mechanicalengagement with the sample.

As further shown in FIG. 6, the mechanical testing instrument 114 iscoupled with the testing assembly platform 200 with the mechanicaltesting instrument linear stage 210. In one example, the mechanicaltesting instrument linear stage 210 provides one or more linear axes ofmovement to the mechanical testing instrument 114. In one example, themechanical testing instrument linear stage 210 provides movement alongan X axis, for instance along an axis parallel to the X axis of the Xaxis linear stage 300 of the linear stage assembly 204.

In one example, the provision of dual linear stages on each of themechanical testing instrument 114 and for the multiple degree of freedomsample stage 116 allows for the positioning of the sample stage surface208 and the mechanical testing instrument 114 in a form factorsubstantially defined by the testing assembly platform 200. Forinstance, if the testing assembly 112 is viewed in a plan view, movementof the sample stage surface 208, for instance along an X axiscorresponding to the X axis linear stage 300 shown in FIG. 6, wouldnormally move the sample stage surface 208 relative to the testingplatform 200 and in some circumstances move one or more of the linearstages 300-304 and/or the rotation and tilt stages 600, 602substantially out of the perimeter of the testing assembly platform 200.When used in cooperation with the mechanical testing instrument linearstage 210, the mechanical testing instrument linear stage may be movedin an opposed direction relative to the movement of the multiple degreeof freedom sample stage 116 along the linear axis of the mechanicaltesting instrument linear stage 210. In this manner, the projection ofthe mechanical testing instrument 114 and the multiple degree of freedomsample stage 116 outside of the boundary of the testing platform 200 issubstantially minimized. Stated another way, if the sample stage surface208 requires orientation into a configuration that would push themultiple degree of freedom sample stage 116 substantially outside of thebounds of the testing platform 200, for instance to orient the samplerelative to an instrument as well as the mechanical testing instrument114. The mechanical testing instrument 114 may instead be cooperativelymoved in an opposed direction to thereby minimize the projection of boththe mechanical testing instrument 114 and the multiple degree of freedomsample stage 116 beyond the perimeter of the testing assembly platform200.

Referring again to FIG. 6, the linear stage assembly 204 is shown againwith the schematic representation. For instance, the Y axis linear stage302 includes a stage base 308A and a stage platform 308B. Similarly, theX axis linear stage 300 includes a stage base 310A and a stage platform310B. The Z axis linear stage 304 includes a stage base 312A and a stageplatform 312B. As shown in FIG. 6, the stage platforms and stage basesof each of the stages, including the rotation and tilt stages 600, 602,may, in some examples, be integral to corresponding stage bases andstages of other actuators. For instance, the stage platform 308B of theY axis linear stage 302 is coupled with or integral to the stage base310A of the X axis linear stage 300. In a similar manner, the stage base604A of the rotation stage 600 is integral to or coupled with the stageplatform 312B of the Z axis linear stage 304.

The multiple degree of freedom sample stage 116 with the linear stageassembly 204, including the X, Y and Z axes linear stages 300-304 aswell as the rotation and tilt stages 600, 602, provides at least fivedegrees of freedom for the sample stage surface 208. As described above,the mechanical instrument linear stage 210 provides an enhanced degreeof freedom and flexibility for cooperative positioning of the samplestage surface 208 as well as the mechanical testing instrument 114. Inthe case of the multiple degree of freedom sample stage 116, the X axislinear stage 300 is configured to provide movement of at least thesample stage surface 208 into and out of the page as shown in FIG. 6. Ina similar manner, the Y axis linear stage 302 is configured to providemovement of the sample stage surface 208 from the left to the right orthe right to the left as shown in FIG. 6. The Z axis linear stage 308correspondingly provides movement of the sample stage surface 208towards the top and the bottom of the page as shown in FIG. 6. Therotation stage 600 provides rotation of the sample stage surface 208 andthe tilt stage 602 provides tilting of the sample stage surface 208. Themultiple degrees of freedom (e.g., five or more degrees of freedom)provided by at least the multiple degree of freedom sample stage 116thereby provides flexibility in the orienting and positioning of thesample stage surface 208 relative to any of the instruments 104-110 showin FIG. 1 as well as the mechanical testing instrument 114. Thepositioning of the sample stage surface 208 is performed within thetight clustered area provided by the instruments 104-110 in one example.Stated another way, the multiple degree of freedom sample stage 116allows for the positioning of the sample stage surface 208 in any of avariety of orientations directed into or out of the coincidence region222 defined by the working regions of one or more of the instruments104-110 and allows for the reliable and accurate positioning of thesample on the sample stage surface 208 according to the workingparameters of each of the instruments 104-110 while at the same timeproviding sufficient flexibility to allow interaction with themechanical testing instrument 114, for instance, contemporaneously withobservation by any one of the one or more instruments 104-110.

Cross Roller Bearing Assembly

As described herein, in one example, cross roller bearing assemblies 706(See FIG. 7) are included between the stage platform and stage bases ofone or more of the linear stages such as the X, Y, and Z axis linearstages 300-304 of the linear stage assembly 204 and the mechanicaltesting instrument linear stage 210. In one example, the cross rollerbearing assemblies 706 are interposed between the stage base 310A andthe stage platform 310B of the X axis linear stage 300 as shown in FIG.7. In the example shown in FIG. 7, dual cross roller bearing assemblies706 are interposed between the stage platform and base 310B, A. Asshown, the stage platform 310B includes a first rail channel 900extending into and out of the page substantially parallel to the linearaxis of the X axis linear stage 300. A second rail channel 902correspondingly extends into and out of the page along the portions ofthe actuator housing 801 (e.g., associated in one example with the stagebase 310A). The first and second rail channels 900, 902 cooperate toform grooves sized and shaped to receive the plurality of rollerbearings 908 therein.

As shown, for instance, in FIG. 7, the first and second rail channels900, 902 include opposed pairs of interface surfaces. In one example,the first rail channel 900 includes a first interface surface 904A andthe second rail channel 902 includes a second interface surface 904Bopposed to the first interface surface 904A. In corresponding manner,the second rail channel 902 includes a first interface surface 906A andthe first rail channel 900 includes a second interface surface 906Bopposed to the first interface surface 906A. The like numbered interfacesurfaces 904A, B, and 906A, B form opposed pairs of interface surfacesaligned with and extending parallel to the linear axis of the respectivelinear stage.

The roller bearings 908 are positioned within the first and second railchannels 900, 902 and provide the moveable interface between the stageplatform 310B and the stage base 310A. For instance, in each of thefirst and second rail channels 900, 902 of each of the cross rollerbearing assemblies 706, a plurality of roller bearings 908 arepositioned therein. In one example, the first and second rail channels900, 902 of the cross roller bearing assembly 706 shown on the left ofFIG. 7 include five or more roller bearings 908 provided therein. Theroller bearings 908 are provided in an alternately crossed configurationwhere the cylindrical bearing surfaces 910 (e.g., the cylindricalsurfaces of the roller bearings 908 as opposed to the end surfaces ofthe bearings) are arranged at 90 degree angles relative to eachsuccessive roller bearing within the first and second rail channels 900,902. The roller bearings 908 within the first and second rail channels900, 902 of the cross roller bearing assembly 706 on the right side ofthe X axis linear stage 300 shown in FIG. 7 are similarly positionedwithin the first and second rail channels 900, 902 in an alternatelycrossed configuration. The cylindrical bearing surfaces 901 cooperatewith the opposed interface surfaces 904A, 904B, and 906A, 906B toprovide opposed surface to surface engagement between the interfacesurfaces that correspondingly provides a robust structural couplingbetween the stage base 310A and the stage platform 310B.

For instance, with the configuration shown in FIG. 7 movement of thestage platform 310B relative to the stage base 310A, for instance byapplication of lateral force to one or more of the stage platform 310 orthe stage base 310A (e.g., orthogonal or off-axis to the linear axis ofthe X axis linear stage 300), is substantially minimized. The surface tosurface engagement between the roller bearings 908 and the interfacesurfaces 904A, B, and 906A, B minimizes relative tilting or lateralmovement of the stage platform and stage base 310B, 310A. Stated anotherthe way, the roller bearings 908 and their crossed configuration withinthe first and second rail channels 900, 902 provide alternating surfaceto surface interfaces between the opposed interface surfaces 904A, B,and 906A, B, to substantially prevent relative movement orthogonal tothe linear axis of the X axis linear stage 300. That is to say,tolerances otherwise provided in other bearing systems (and multipliedacross multiple stages coupled in series) are minimized between themultiple stages of the linear stage assembly 204 and the linear stage210 used with the mechanical testing instrument 114.

The cylindrical bearing surfaces 910 in one example have a shorterlength relative to the diameter of the planar end surfaces 912 of eachof the roller bearings 908. Because the planar end surfaces 912 have alarger diameter than the length of the cylindrical bearing surfaces 910,movement and engagement of the roller bearings 908 with the opposedinterface surface 904A, 904B, and 906A, 906B at the first and secondrail channels 900, 902 is focused on the cylindrical bearing surfaces910. Stated another way, the cylindrical bearing surfaces 901 areshorter than the distance between the opposed interface surfaces 904A,904B and 906A, 906B. With the planar end surfaces 912 having a greaterdiameter than the length of the cylindrical bearing surfaces 910,affirmative engagement between the planar end surfaces 912 and theopposed pairs of interface surfaces 904A, 904B, and 906A, 906B isminimized. Instead, the movable coupling is provided between thecylindrical bearing surfaces 910 and the opposed interface surfaces.Only incidental engagement between the planar end surfaces 912 of theroller bearings 908 and the opposed interface surfaces 904A, 904, and906A, 906B occurs. Stage platform 310B is thereby able to smoothly moverelative to the stage base 310A along the linear axis of the stageaccording to operation of the actuator 301 while being constrainedagainst movement along non-parallel axes as described herein. That is tosay, the cross roller bearing assemblies 706 guide movement of the stageplatform 310B along the linear axis (the direction of translation) ofthe stage, while at same time constraining (e.g., minimizing oreliminating) lateral movement, tilting and the like of the stageplatform 310B relative to the stage base 310A and the linear axis of thestage.

Importantly, the actuator 301 is able to accurately and reliably movethe stage platform 310B relative to the stage base 310A according theminimized tolerance of the cross roller bearing assembly 706. That is tosay, the stage platform 310B is constrained to move only along thelinear axis of the X axis linear stage 300. Orthogonal movement, forinstance, movement due to tolerances between spherical bearings and thelike between a stage platform and a stage base is substantiallyprevented by the cross roller bearing assembly 706 (or assemblies in oneexample). The interface surfaces 904A, 904B and 906A, 906B incombination with the alternately crossed roller bearings 908substantially prevents tilting and lateral movement of the stageplatform 310B relative to the stage base 310A.

In one example, the roller bearings 908 described herein are constructedwith, but not limited to, a ceramic material such as silicon nitride. Byconstructing the roller bearings 908 with a ceramic material such assilicon nitride, roller bearings 908 may be packed within the first andsecond rail channels 900, 902 in a side-by-side relationship. Forinstance, the plurality of roller bearings 908 in each of the first andsecond roll channels 900, 902 may be positioned within the channelsuccessively with the roller bearings 908 in engagement with each other(e.g., in an alternating crossing relationship as described herein). Theroller bearings 908 have a minimal coefficient of friction in engagementof the roller bearings 908, for instance along their cylindrical bearingsurfaces 910. The minimized friction has minimal effect on the ease ofmovability of the stage platform 310B relative to the stage base 310A.In another example, the first and second rail channels 900, 902, forinstance, of the actuator housing 801 and the stage 310B are constructedwith similar or identical materials to the stage base and platform 310A,B, for instance, titanium, steel, and the like.

Rotation and Tilt Stage Assembly

FIG. 8A shows an isometric view of the rotation and tilt assembly 206previously shown in FIG. 2. As described herein, the rotation tiltassembly 206 is configured for coupling in series with the linear stageassembly 204. In other examples, the rotation and tilt stage assembly206 is configured for interposing coupling between one or more of thelinear stages 300-304 as described herein. In still another example, therotation and tilt stage assembly 206 is configured for positioningbetween the testing assembly platform 200 and one or more of the linearstages of the linear stage assembly 204.

Referring again to FIG. 8A, the rotation and tilt stage assembly 206includes the rotation stage 600 and the tilt stage 602 coupled with therotation stage. As shown, a rotation stage housing 1000 extends aroundthe rotation stage 600. Similarly, a tilt stage housing 1002 extendsover at least a portion of the tilt stage 602. The sample stage surface208 is shown coupled with the tilt stage 602. In one example, therotation stage housing 1000 includes an electrical interface 1004providing rotation and tilt sockets 1006 for coupling with actuation andsensing cabling 212, for instance, for encoder measurements andinstructions to operate and detect the position of the rotation and tiltstages 600, 602.

Referring now to FIG. 8B, the rotation and tilt stage assembly 206 aspreviously shown in FIG. 8A is shown in cross section. The rotationstage 600 includes a rotation stage platform 1008B and a rotation stagebase 1008A. Similarly the tilt stage 602 includes a tilt stage base1010A and a tilt stage platform 1010B. In one example, the rotationstage platform 1008B and the tilt stage base 1010A are incorporated intoa rotation spindle assembly 1018. As shown in FIG. 8B, the rotationspindle assembly 1018 is configured for rotatable movement within therotation stage housing 1000.

In one example, a plurality of rotational bearings 1012, 1014 areprovided between the rotation spindle assembly 1018 and the rotationstage housing 1000. The rotational bearings 1012, 1014 facilitate therotation of the rotation spindle assembly 1018 relative to the housing1000. In one example, the rotational bearings 1012, 1014 include aplurality of ball bearings interposed between the respective rotationstage housing 1000 and the rotation spindle assembly 1018. In a similarmanner to the rotation spindle assembly 1018, the tilt stage 602 in oneexample includes a tilt spindle assembly 1020 incorporating the tiltstage platform 1010B. The tilt spindle assembly 1020 is movably coupledwith the rotation spindle assembly 1018, for instance, with tiltbearings 1016 on either side of the tilt spindle assembly 1020. In oneexample, the tilt bearings include ball bearings interposed between thetilt spindle assembly 1020 and the rotation spindle assembly 1018.Optionally, one or both of the rotation and tilt stages 600, 602 includerespective rotation encoders 1022 and tilt encoders 1024 to accuratelymeasure the position of the respective rotation spindle assembly 1018relative to the rotation stage housing 1000 and the position of the tiltspindle assembly 1020 relative to the rotation spindle assembly 1018.

Rotation Stage

FIG. 9 shows the rotation and tilt stage assembly 206. In the exampleshown, the rotation stage housing 1000 has been removed to expose thecomponents within the rotation stage 600. As previously described, therotation and tilt assembly 206 includes a rotation stage 600 coupledwith a tilt stage 602. Referring to FIG. 9, the rotation stage 600 asshown includes the rotation stage platform 1008B rotationally coupledwith the rotation stage base 1008A. As previously described, in oneexample the rotation stage platform 1008B includes a rotation spindleassembly 1018 including a portion of, for instance, the tilt stage base1010A. (See FIG. 8B). Optionally, the sample rotation stage 610 shown inFIG. 6 is configured similarly to the rotation stage 600 (e.g. withsimilar motor assemblies and a similar clamping assembly).

As shown in FIG. 9, the rotation stage 600 includes a plurality of piezomotor assemblies 1102A-C (e.g., motors) positioned around the rotationstage 600. Each of the piezo motor assemblies 1102A-C includes first andsecond opposed piezo motors 1104A, B (e.g., motor elements). Interposedbetween each of the first and second opposed motors 1104A, B is a driveshoe 1106 engaged with the stage platform 1008B. In one example, thestage platform 1008B includes a rotation flange 1100 coupled with theremainder of the stage platform 1008B. As shown in FIG. 9, the rotationflange 1100 extends around and is engaged with the drive shoes 1106 ofthe piezo motor assemblies 1102A-C. In one example, the piezo motorassemblies 1102A-C work in parallel to move the rotation flange 1100 toeffectuate rotation of the rotation spindle assembly 1018. For instance,the first opposed motors 1104A of each of the piezo motor assemblies1102A-C are operated in parallel (e.g., simultaneously expanded andrelaxed following a saw tooth drive signal to move the drive shoes 1106)to effectuate rotation in one direction while the second opposed motors1104B of the piezo motor assemblies 1102A-C are operated in parallel toeffectuate rotation of the rotation spindle assembly 1018 in an opposeddirection (e.g., clockwise versus counterclockwise). Optionally, theopposed motors 1104A of each of the assemblies 1102A-C are operated insequence (each expanding and relaxing in a preceding or succeedingfashion to the other motors 1104A) to rotate the rotation spindleassembly 1018 in a first direction. Similarly, the opposed motors 1104Bof each of the assemblies 1102A-C are operated in sequence to rotate therotation spindle assembly 1018 in a second opposed direction. In yetanother option, the rotation stage 600 includes one or more motorassemblies (e.g., one or more of motor assemblies 1102A-C) and one ormore of the motor assemblies are operated to actuate the rotation stage600.

Referring again to FIG. 9, the piezo motor assemblies 1102A-C are showncoupled with a motor support ring 1108 extending beneath and around therotation flange 1100. The motor support ring 1108 provides a robuststructure for the support of each of the piezo motor assemblies 1102A-C.Additionally, the motor support ring 1108 is supported within therotation stage base 1008A by a support column 1112 coupled with aplurality of spring elements 1114A, B (e.g., separate spring elements orvirtual spring elements of the same spring). As shown in FIG. 9, theplurality of support columns 1112 and spring elements 1114A, B arearranged around the motor support ring 1108 and thereby provide a solidbut deflectable coupling with the remainder of the rotation stage base1008A. The motor support ring 1108 in another example includes springcontact points 1116 positioned adjacent to the sides the piezo motorassemblies 1102A-C (e.g., bracketing the assemblies or having theassemblies interposed therebetween). Optionally, the motor support ring1108 includes one or more contact points 1116 (one, two, three or morecontact points). In one example, a single contact point 1116 isassociated with each of the one or more motor assemblies 1102A-C.

In the example shown in FIG. 9, the spring elements 1114A, B positionedon either side of the support columns 1112 (separate springs or elementsof a single spring having plural elements extending to the separatecontact points 1116 extending from the support column 112) are coupledbetween the spring contact points 1116 and the support column 1112. Aswill be described in further detail below, the spring elements 1114A, Bprovide opposed biasing support to each of the piezo motor assemblies1102A-C to provide a clamping function through the piezo motorassemblies 1102A-C to the rotatable spindle assembly 1018. In otherwords, the spring elements 1114A, B clamp the spindle assembly 1018(e.g., the stage platform 1008B) statically relative to the stage base1008A) when the piezo motor assemblies 1102A-C are not otherwiserotating the spindle assembly.

Referring again to FIG. 9, a clamping assembly 1110 is shown at eitherend of the rotation spindle assembly 1018. In one example, the clampingassembly 1110 includes, for instance, the rotation bearing 1014 coupledwith the rotation stage base 1008A as well as the spring elements 1114A,B. As previously described, the spring elements 1114A, B are coupledbetween the support column 1112 and the spring contacts 1116. The springelements 1114A, B bias the motor support ring 1108 as well as the piezomotor assemblies 1102A-C in an upward direction toward the rotationflange 1100. While the piezo motor assemblies 1102A-C are in a relaxedstate (e.g., are not being operated to effectuate rotation of therotation spindle assembly 1018) the spring elements 1114A, B bias themotor support ring 1108 upwardly and thereby affirmatively engage thedrive shoes 1106 against a first surface of the rotation flange 1100 tosubstantially prevent undesired rotation of the rotation spindleassembly 1018. Stated another way, the rotation spindle assembly 1018 islocked in place and static even when acted upon by outside forces, forinstance, upon the tilt spindle assembly 1020 and rotation spindleassembly 1018 (e.g., through mechanical testing of a sample). The driveshoes 1106 of the piezo motor assemblies 1102A-C statically hold therotation spindle assembly 1018 in place through the application offriction through the normal force applied by the spring elements 1114A,B of each of the springs arranged around the motor support ring 1108.

As shown in FIG. 9, in one example the spring elements 1114A, B includemultiple spring elements extending between the support column 1112 andthe spring contacts 1116. Optionally, the spring elements 1114A, Binclude spring elements having at least one switchback extending betweena support column 1112 and the spring contacts 1116. In another example,the spring elements 1114A, B each include a single spring elementextending between the support column 1112 and each of the springcontacts 1116. The spring elements 1114A, B (whether a single spring ormultiple springs) in one example, include, but are not limited toflexural springs having a substantially flat perimeter that is layeredone or more times over itself in a serpentine fashion.

As shown in FIG. 9, each of the drive shoes 1106 is arranged around themotor support ring 1108. When engaged with the rotation flange 1100 thedrive shoes 1106 of each of the three piezo motor assemblies 1102A-Cprovide a solid upward biased support to the rotation flange 1100 andthereby clamp the rotation flange 1100 between a clamping surfaceincluding, but not limited to, the rotation bearing 1014 (engaged alonga second surface of the rotation flange) and the drive shoes 1106(engaged along a first surface of the rotation flange) to effectuate thestatic locked positioning of the rotation flange 1100 and the rotationspindle assembly 1118 coupled with the flange 1100. Stated another way,the clamping assembly 1110 clamps the stage platform 1008B between thespring elements 1114A, B (and in one example the motor assemblies1102A-C) and an opposed portion of the stage base 1008A (e.g., aclamping surface) to lock the stage platform 1008B in place. Asdescribed herein, in one example, the clamping assembly 1110 clampsaround first and second surfaces of a portion of the stage platform1008B, such as the rotation flange 1100, with the spring biased motorassemblies 1104A-C and the rotational bearing 1014 associated with thestage base 1008A.

Tilt Stage

FIGS. 10A and 10B show respective perspective and cross sectional viewsof the tilt stage 602 of the rotation and tilt stage assembly 206previously shown in FIG. 2. Referring first to FIG. 10A, the tilt stage602 is shown including the tilt stage platform 1010B and the tilt stagebase 1010A. As previously described, in one example the tilt stage base1010A is incorporated in the rotation spindle assembly 1018 previouslydescribed and shown in FIGS. 8A and 8B. The tilt stage platform 1010B isincorporated into a tilt spindle assembly 1020 rotatably coupled withthe rotation spindle assembly 1018. As shown in FIG. 12, the tiltspindle assembly 1020 is supported in one example by the tilt bearings1016 that facilitate rotational movement of the tilt spindle assembly1020 relative to the rotation spindle assembly 1018. In one example, anaxle 1200 extends through the tilt spindle assembly 1020 and supportsboth the tilt bearings 1016 as well as the tilt spindle assembly 1020therebetween. Optionally, the sample rotation stage 610 shown in FIG. 6is configured similarly to the tilt stage 602 (e.g. with similar motorassemblies and a similar clamping assembly).

As previously described, the tilt stage 602 is configured to providetilting movement to the sample stage surface 208. For instance, the tiltstage 602 includes motor assemblies 1202A, B (e.g., piezo motorassemblies, or motors), positioned for driving engagement with the tiltspindle assembly 1020. As shown in FIG. 10A, the piezo motor assemblies1202A, B, include two piezo motor assemblies. In another example, two ormore piezo motor assemblies are provided. The piezo motor assemblies1202A, B are positioned within a motor support saddle 1206 coupled withthe tilt stage base 1010A (e.g., the rotation spindle assembly 1018).The piezo motor assemblies 1202A, B each include first and secondopposed motors 1204A, B (e.g., motor elements). In one example, thefirst and second opposed motors 1204A, B include piezo elements.Referring to FIG. 10B, the piezo motors 1204A are configured to work inparallel (e.g., simultaneously expand and contract (relax)) to rotatethe tilt spindle assembly 1020 in a clockwise direction while the piezomotors 1204B are configured to work in parallel to rotate the tiltspindle assembly 1020 in a counterclockwise direction. As shown, each ofthe first and second opposed motors 1204A, B are engaged with respectivedrive shoes 1205 associated with each of piezo motor assemblies 1202A,B. Stated another way, each of the first and second opposed motors1204A, B of each piezo motor assembly 1202A, B engage with a singledrive shoe 1205. The drive shoes 1205 of each piezo motor assembly1202A, B thereby receive driving forces (from expansion of the piezomotors) from one or both of the first and second opposed motors 1204A, Bof each of the piezo motor assemblies. Optionally, separate drive shoesare provided for each of the first and second opposed motors 1204A, B.In yet another option, the first opposed motors 1204A of each of theassemblies 1202A, B act in sequence (preceding or succeeding relative toeach other) to rotate the tilt spindle assembly 1020 in a firstdirection, and the second opposed motors 1204B act in sequence to rotatethe tilt spindle assembly 1020 in a second opposed direction.

The tilt stage 602 further includes a clamping assembly 1208 configuredto fix the tilt spindle assembly 1020 in a static orientation uponconclusion of movement through the piezo motor assemblies 1202A, B. Inone example, the clamping assembly 1208 includes opposed clampingsurfaces provided by one or more of the axle 1200 and the piezo motorassembly 1202-B including, for instance, the drive shoes 1205. Forinstance, as shown in FIG. 10B, the tilt spindle assembly 1020 is showninterposed between the axle 1200 and the drive shoes 1205 of each of thepiezo motor assemblies 1202A, B. In one example the axle 1200 issupported by the tilt bearings 1016 coupled with the tilt stage base1010A. Through one or more of the tilt bearings 1016 or direct couplingof the axle 1200 with the tilt stage base 1010A, the axle is supportedby the tilt stage base 1010A to provide structural support for theclamping assembly 1208 and to assist the drive shoes 1205 inaffirmatively engaging the tilt spindle assembly 1020 for staticpositioning of the assembly after the sample stage surface 208 ispositioned as desired.

Referring again to FIG. 10B the clamping assembly 1208 includes asupport base 1210 forming a portion of the rotation spindle assembly1018 in one example. The support base 1210 is sized and shaped toreceive a plurality of axial spring elements 1212A, B. The axial springelements 1212A, B extend between the support base 1210 and the motorsupport saddle 1206. In one example, the axial spring elements 1212A, Bbias the motor support saddle 1206 and thereby bias the piezo motorassemblies 1202A, B as well as the drive shoes 1205 into an affirmativeengagement with the tilt spindle assembly 1020. The affirmativeengagement of the drive shoes 1205 with the tilt spindle assembly 1020ensures the drive shoes 1205 frictionally engage the tilt spindleassembly 1020 to ensure driving of the piezo motor assemblies 1202A, Bresults in accurate tilting of the tilt spindle assembly 1020.Additionally, the bias provided by the axial spring elements 1212A, Bensures the affirmative engagement provided by the drive shoes 1205provides a static frictional engagement with the tilt spindle assembly1020 while the piezo motor assemblies 1202A, B are relaxed (e.g., notoperated) to thereby clamp the tilt spindle assembly 1020 between thepiezo motor assemblies 1202A, B as well as the axle 1200 (e.g., the tiltbearings 1016).

In one example, the axial spring elements 1212A, B include axial springelements 1212A, B each associated with respective sides of the piezomotor assemblies 1202A, B. For instance, the axial spring element 1212Ais associated with the piezo motor 1204B and the axial spring element1212B is associated with the piezo motor 1204A. The axial springelements 1212A, B thereby provide opposed biasing to each of the piezomotors 1204A, B to ensure that the piezo motors including the driveshoes 1205 are affirmatively biased into engagement with the tiltspindle assembly 1020 to ensure static clamping of the tilt spindleassembly while the piezo motor assemblies 1202A, B are not operated.Stated another way, a biasing force is provided to each of the opposedfirst and second piezo motors 1204A, B to provide a corresponding forcevector through each of the piezo motors to the drive shoe 1205 andthereby substantially prevent tilting or sliding of the drive shoe 1205off of the tilt spindle assembly 1020. The axial spring elements 1212A,B associated with each of the piezo motor assemblies 1202A, B therebyprovide affirmative engagement on at least two points around the tiltspindle assembly 1020. The axle 1200 thereby clamps the tilt spindleassembly 1020 at a point of contact at the axle and the tilt spindleassembly 1020 between two points of contact formed by the drive shoes1205 and the tilt spindle assembly 1020. The tilt spindle assembly 1020is thereby clamped at three points on opposed surfaces of the tiltspindle assembly to ensure that the tilt spindle assembly is staticallyheld in place when the first and second opposed motors 1204A, B of themotor assemblies 1202A, B are not operated. Optionally, the axial springelements 1212A, B are consolidated into unitary springs that supporteach of the piezo motor assemblies 1202A, B (e.g., to the left and theright sides of the motor support saddle 1206, immediately below each ofthe assemblies 1202A, B, or the like).

Lateral Spring Elements of the Tilt Stage

Referring again to FIG. 10A, in another example the tilt stage 602, forinstance the clamping assembly 1208, further includes lateral springelements 1214A, B to provide lateral support to the support saddle 1206and the axial spring elements 1212A, B. The lateral spring elements1214A, B support the motor support saddle 1206 and the axial springelements 1212A, B as they bias the drive shoes 1205 of each of the piezomotor assemblies 1202A, B into engagement with the tilt spindle assembly1020. For instance, the lateral spring elements 1214A, B substantiallyprevent the lateral movement of the piezo motor assemblies 1202A, B outof engagement or out of alignment with the tilt spindle assembly 1020.Instead, the lateral spring elements 1214A, B constrain depression andelevation of the motor support saddle 1206 (through deflection of theaxial spring elements 1212A, B) to substantially axial depression andelevation to ensure that the drive shoes 1205 engage insurface-to-surface contact with the tilt spindle assembly 1020throughout operation of the piezo motor assemblies 1202A, B as well asstatic positioning of the tilt spindle assembly 1020.

As shown in FIG. 10A, the lateral spring elements 1214A, B are coupledbetween the tilt stage base 1010B, such as the rotation spindle assembly1018 (the support base 1210), and the motor support saddle 1206. Gaps1300 are formed between the motor support saddle 1206 and the supportbase 1210 to facilitate the axial deflection of the axial springelements 1212A, B with corresponding movement of the motor supportsaddle 1206 and the first and second piezo motor assemblies 1202A, B. Asshown, the lateral spring elements 1214A, B bridge the respective gaps1300 (on either side of the saddle 1206) and thereby provide deflectablelateral support to each side of the motor support saddle 1206. Thelateral spring elements 1214A, B thereby ensure the motor support saddle1206 is able to move upwardly and downwardly according to the biasprovided by the axial spring elements 1212A, B as well as deflectioncaused by movement of the first and second opposed motors 1204A, B ofeach of the piezo motor assemblies 1202A, B.

The lateral spring elements 1214A, B constrain the motion of the supportsaddle 1206, the axial spring elements 1212A, B as well as the piezomotor assemblies 1202A, B to axial movement while substantiallypreventing lateral movement of the associated components. Byconstraining the motor support saddle 1206 the axial spring elements1212A, B and the piezo motor assemblies 1202A, B to axial movementlateral misalignment of the drive shoes 1205, for instance, with thetilt spindle assembly 1020 shown in FIGS. 10A and 10B is therebysubstantially avoided. The drive shoes 1205 are thereby maintained in anaffirmative surface-to-surface engagement with the tilt spindle assembly1020 throughout operation of the piezo motor assemblies 1202A, B, aswell as in the static retaining configuration where the drive shoes 1205frictionally engage with the tilt spindle assembly 1020 to substantiallyprevent undesired tilting movement of the tilt spindle assembly 1020(e.g., the tilt stage platform 1010B) relative to the tilt stage base1010A (e.g., the support base 1210 where the rotation spindle assembly1018).

Testing Assembly Including a Stage for Use with a Mechanical TestingInstrument

FIG. 11 shows another example of the testing assembly 1400 configuredfor use, for instance, with the multi-instrument assembly 100 shown inFIG. 1. At least some of the features of the testing assembly 1400 aresimilar or identical to previously described features herein and areincorporated with regard to the testing assembly 1400. As shown in FIG.11, the testing assembly 1400 includes a multiple degree of freedomsample stage 116 including a linear stage assembly 204 and a rotationand tilt stage assembly 206 coupled with the linear stage assembly 204.The rotation and tilt stage assembly 206 includes a sample stage surface208. The multiple degree of freedom sample stage 116 as previouslydescribed, is configured to move the sample stage surface 208 into avariety of orientations and positions to facilitate observation andinteraction with a sample on the sample stage surface 208, for instance,for with the mechanical testing instrument 1402 as well as any of thefirst-fourth instruments 104-110 shown in FIG. 1.

In one example, the multiple degree of freedom sample stage 116 isconfigured to move the sample stage surface 208 into theseconfigurations to facilitate one or more of observation and interactionof the sample on the sample stage surface 208 contemporaneously. Forinstance, two or more instruments observe or interact with the sample onthe sample stage surface at the same time according to the positioningof the sample stage surface 208 with one or more of rotation, tilting,and linear positioning of the sample stage surface 208 (e.g., with themultiple degree of freedom sample stage 116). In another example, themechanical testing instrument linear stage 210 cooperates with themultiple degree of freedom sample stage 116 to facilitate thepositioning of the mechanical testing instrument 1402 relative to thesample stage surface 208 within the microscope chamber 102 shown in FIG.1.

As shown in FIG. 11, the testing assembly 1400 includes the mechanicaltesting instrument 1402, such as an indenter, scratching instrument,tensile instrument, sensor, observation tool and the like. In oneexample the mechanical testing instrument 1402 includes a modularinstrument configured for selective coupling with a stage 1408. Forinstance, the mechanical testing instrument 1402 includes, but is notlimited to, a high load and a low load indenter wherein the high loadmechanical testing instrument 1402 is configured to provide much largerindentation forces to a sample compared to the low load mechanicaltesting instrument. As shown in FIG. 11, each of the mechanical testinginstruments 1402 includes an instrument shaft 1404 coupled with atransducer or sensor positioned within the mechanical testinginstrument. Each of the mechanical testing instruments 1402 furtherincludes an instrument tip 1406 configured for engagement with andinteraction with a sample on the sample stage surface 208.

In one example, the mechanical testing instrument 1402 includes aplurality of modular replaceable transducers configured to providevarying forces and displacement ranges for the instrument tip 1406. Forinstance, in one example the mechanical testing instrument 1402 includesthe low load transducer configured for 10 milli-Newtons of force andactuation of plus or minus 15 microns of bidirectional electrostaticactuation. In another example, the mechanical testing instrument 1402includes another transducer, for instance, the high load transducer(described above) configured for maximum forces of at least 30milli-Newtons with at least 80 microns worth of travel in the directionof the sample stage surface 208 provided by actuation stage 1408.Optionally, a variety of selectable load cells are available for one ormore of the high or low load transducers that provide varying forceranges and sensitivity.

The stage 1408 (e.g., a stage providing linear movement along the Yaxis) as described herein on the mechanical testing instrument linearstage 210 (providing linear movement along the X axis) provides asupplemental means or an alternative means for engaging the instrumenttip 1406 or indenting the instrument tip 1406 into the sample on thesample stage surface 208. Stated another way, the stage 1408 isconfigured to provide the actuation force, for instance, the force forindenting the instrument tip 1406 into the sample on the sample stagesurface 208. The stage 1408 in one example is configured to providedisplacement of the test instrument while the mechanical testinginstrument 1402 including a transducer therein is configured to detectthe force applied to the sample stage surface 208 as well as thedisplacement of the instrument tip 1406 upon engagement with the sampleaccording to operation of the stage 1408.

Referring now to FIG. 12, one example of the stage 1408 is shown indetail with the mechanical testing instrument 1402 removed. As shown inFIG. 12 the stage 1408 includes a stage base 1500A and a stage platform1500B movably coupled with the stage base 1500B. As shown, the stageplatform 1500B is movably coupled relative to the stage base 1500A, forinstance with flexural springs 1512. An actuator, such as a piezoactuator 1502, is coupled between the stage base 1500A and the stageplatform 1500B. The piezo actuator 1502 cooperates with the flexuralsprings 1512 to guide the stage platform 1500B along a linear axis(e.g., an X, Y or Z axis dependent on the orientation of the stage1408). In the example shown in FIG. 12, the stage 1408 guides movementof the stage platform 1500B along a linear Y axis (e.g., toward thesample stage surface 208). The stage 1408 for positioning and actuatingthe mechanical testing instrument 1402 includes, but is not limited to,linear drive stages having stepper motors, piezo actuators or motors,voicecoil actuators, stick-slip actuators and the like. The stage 1408includes, but is not limited to, one or more linear stages manufacturedand sold by Physik Instrumente GmbH & CO. of Germany; Dynamic Structuresand Materials, LLC of Franklin, Tenn.; Attocube Systems AG of Germany;SmarAct GmbH of Germany; and PiezoSystem Jena GmbH of Germany. Oneexample of the stage 1408 is a flexural stage provided by DynamicStructures and Materials, LLC. The operation of the stage 1408, forinstance one or more of the stages provided above, moves the stageplatform 1500B relative to the stage base 1500A in a guided, controlledmanner that substantially ensures that the motion of the mechanicaltesting instrument 1402 (see FIG. 11) is in a linear direction and nototherwise tilted, canted, or the like relative to the desired linearaxis of movement.

In another example the stage 1408 includes a displacement sensor 1514configured to measure the displacement of the stage platform 1500B. Thedisplacement sensor 1514 is thereby able to cooperate with thetransducer of the mechanical testing instrument 1402 to measure thedisplacement of the stage platform 1500B and the correspondingdisplacement of the mechanical testing instrument 1402, as well as itsinstrument tip 1406 during operation of the testing assembly 1400. Inone example, upon engagement of the instrument tip 1406 with a sample onthe sample stage surface 208, the force measurement through thetransducer in the mechanical testing instrument 1402 begins to rise.When coupled with the displacement measurements of the displacementsensor 1514, the force measurements and displacement measurements of therespective transducer of the mechanical testing instrument 1402 and thedisplacement sensor 1514 are together used to determine one or moremechanical properties of the sample on the sample stage surface 208. Inanother example, the stage 1408 includes an electrical socket 1516configured to operate the actuator 1502 as well as receive measurementsfrom the displacement sensor 1514 and interface those measurements witha processor and user interface configured for displaying suchinformation.

Operation of the Testing Assembly

Referring again to FIG. 2, the testing assembly 112 is shown with themultiple degree of freedom sample stage 116 and the mechanical testinginstrument 114 positioned on a testing assembly platform 200. Aspreviously described, in one example, the multiple degree freedom samplestage 116 includes both a linear stage assembly 204 and a rotation andtilt stage assembly 206. The linear stage assembly 204 and the rotationand tilt stage assembly 206 are configured to move the sample stagesurface 208 including, for instance, a sample thereon within a regionwithin a microscope assembly, for instance, a localized coincidenceregion such as the region 222 shown in FIG. 2.

In one example, the localized coincidence region 222 is defined by theworking regions of the instruments, such as the instruments 104, 106,108, 110 shown in FIG. 2. Operation of the testing assembly 112 beginswith the sample stage surface 208 as shown. For instance, the samplestage surface 208 is shown at a substantially orthogonal angle to themechanical testing instrument 114 including, for instance, theinstrument shaft 406 and the instrument tip 408 previously shown in FIG.4. In this orientation the mechanical testing instrument 114 isconfigured to indent or scratch the sample present on the sample stagesurface 208. In this particular configuration one of the instruments104-110 is similarly configured to contemporaneously observe or interactwith the sample on the sample stage surface 208 while the mechanicaltesting instrument 114 performs one or more mechanical tests on thesample.

In another example, where it is desirable to move the sample stagesurface 208, for instance, to orient the sample relative to anotherinstrument within the multi-instrument assembly 100 the multiple degreeof freedom sample stage 116 is operated to orient the sample stagesurface 208 and the sample thereon relative to the desired instrument.The testing assembly 112, for instance the linear stage assembly 210 ofthe mechanical testing instrument 114, is similarly operated to positionthe mechanical testing instrument 114 in alignment with at least aportion of the sample to allow for in situ contemporaneous mechanicaltesting of the sample while the sample is observed or interacted with byone or more of the instruments 104-110.

Referring now to FIG. 13A, the sample stage surface 208 is shownoriented in a second configuration relative to the first configurationshown in FIG. 2. As shown, the sample stage surface 208 is positioned ina substantially orthogonal position to the position shown in FIG. 2. Forinstance, the rotation and tilt stage assembly 206, in one example,including the rotation stage 600 is operated to move the sample stagesurface 208 into the substantially orthogonal orientation shown. Assimilarly shown in FIG. 13A, in another example, the tilt stage 602(shown in FIG. 6) is operated to tilt or orient the sample stage surface208 in a slightly elevated orientation to the substantially verticalorientation shown in FIG. 2. Stated another way, the planar surface ofthe sample stage surface 208 is oriented at a tilted angle relative tothe orientation shown in FIG. 2. In one example, as shown in FIG. 13A,the orienting of the sample stage surface 208 as well as the samplethereon is conducted to position the sample in an orientation directedtoward one of the instruments, such as the third instrument 108including, for instance, a second electronic back scatter detector(EBSD).

In another example, the linear stage assembly 204 including, forinstance, the X, Y and Z linear stages 300, 302, 304 are operatedthrough the actuators 301 to linearly position the sample stage surface208, coupled with the linear stage assembly 204 by way of the rotationand tilt stage assembly 206, relative to one or more of the instruments104-110. Stated another way, the linear stage assembly 204 is configuredto elevate and translate the sample stage surface 208 relative to thefirst position shown in FIG. 2. That is to say, the linear stageassembly 204 is configured to move the sample stage surface 208 into andout of the page, to the left and right of the page, and vertically(upwardly or downwardly) relative to the page as shown in FIG. 13A.

Referring now to FIG. 13B, a schematic representation of the testingassembly 112 previously shown in FIGS. 2 and 13A is provided showing thesample stage surface 208 in the orientation provided in FIG. 13A. Statedanother way, the sample stage surface 208 is rotated from theorientation shown in FIG. 2 and tilted according to operation of therotation and tilt stage assembly 206 including, for instance, therotation stage 600 and the tilt stage 602. As shown in the example inFIG. 13B, the sample stage surface 208 is oriented in the neworientation shown in FIG. 13A, for instance to orient the sample on thesample stage surface 208 with the instrument 108. As previouslydescribed, the combination of the linear stage assembly 204 includingthe X, Y and Z stages 300-304 and the rotation and tilt stage assembly206 including the rotation and tilt stages 600, 602 provides theflexibility desired for the sample stage surface 208 to be oriented insubstantially any orientation directed to or usable with any one of theinstruments 104-110 as previously described herein. Additionally, in atleast some examples, the orientation of the sample stage surface 208allows for the contemporaneous use of the mechanical testing instrument114 with the sample on the sample stage surface 208 while the sample isobserved or interacted with by any one of the instruments 104-110.

In the example shown in FIG. 13B, an instrument composite footprint 1600is shown in phantom lines extending around at least a portion of thesample stage surface 208. As previously described, in one example, theinstruments such as the instruments 104-110 are tightly clustered aroundthe sample stage surface 208, for instance due to space constraintswithin a multiple instrument assembly 100 as previously shown in FIG. 1.Because of the space constraints the linear stage assembly 204 and therotation and tilt stage assembly 206 work in concert to flexiblyposition and orient the sample stage surface 208 in any of a pluralityof positions to accordingly orient the sample on the sample stagesurface with respect to any of the one or more of the instruments104-110. That is to say the linear stage assembly 204 and the rotationand tilt stage assembly 206 cooperate to position and orient the samplestage surface 208 within a localized coincidence region optionallydefined at least in part by the instrument composite footprint 1600.

In some examples, it is desired to not only orient the sample stagesurface 208 with one or more of the instruments 104-110 but to alsoalign a portion of the sample on the sample stage surface 208 with, forinstance, the mechanical testing instrument 114. The alignment of thesample on the sample stage surface 208 with the mechanical testinginstrument 114 as well as one or more of the instruments 104-110 allowsfor the contemporaneous mechanical testing with the instrument 114 andobservation or interaction with the sample by one or more of theinstruments 104-110. As shown in FIG. 13B, with rotation of the samplestage surface 208, for instance from the orientation originally shown inFIG. 2, the sample stage surface 208 is not only rotated relative to theinstrument 108 but it is also rotated relative to the mechanical testinginstrument 114 shown in the original position in FIG. 13B with dashedlines. In one example, the testing assembly 112 includes a fixedmechanical testing instrument 114 sized and shaped to be positioned atthe orientation shown in phantom lines in FIG. 13B. As shown, in orderfor the sample stage surface 208 to align with the mechanical testinginstrument 114 as positioned, the linear stage assembly 204 must beoperated to recess the sample stage surface 208 (upward along the page)to align the sample stage surface 208 with the mechanical testinginstrument 114 while at the same time positioning the sample relative tothe instrument 108 for one or more of observation or analysis.Positioning of the sample stage surface 208 in the orientation shown inFIG. 13B (i.e., not recessed) is desirable for at least two reasons. Inone example, by recessing the sample stage surface 208 away from theinstrument 108, for instance to align the sample stage surface 208 withthe fixed mechanical testing instrument 114, the sample on the samplestage surface 208 is positioned outside of or at the edge of the workingregion of the instrument 108 thereby frustrating observation with theinstrument 108 if contemporaneous mechanical testing is also desired.Accordingly, it is desirable to move the sample stage surface 208 andthe sample thereon into coincidence with the working region of theinstrument 108 within the localized coincidence region 222 while at thesame time aligning the mechanical testing instrument 114 with the sampleon the sample stage surface 208 for mechanical testing. Providing thelinear stage assembly, such as the linearly stage assembly 210 shown inFIG. 13A, facilitates positioning of the mechanical testing instrument114 in the orientation shown in FIG. 13B. That is to say, the mechanicaltesting instrument 114 is aligned with the sample stage surface 208while at the same time the sample stage surface 208 is positioned withinthe working region of the instrument 108.

Additionally, it is advantageous to move the mechanical testinginstrument 114 in the manner shown to facilitate the continuedpositioning of the sample stage surface 208 including, for instance, therotation and tilt stage assembly 206 outside of an instrument footprint1600. As shown in FIG. 13B, the instrument footprint 1600, in oneexample, extends around at least a portion of the localized coincidenceregion 222. As previously described, the instruments, such as theinstruments 104-110, provide a clustered series of instruments aroundthe sample stage surface 208 and the components of the multiple degreeof freedom sample stage 116 thereby crowding the region and accordinglyrequiring the flexible positioning of the sample stage surface 208, forinstance, with the combination of the linear stage assembly 204 and therotation and tilt stage assembly 206. Where alignment of the samplestage surface 208 with the mechanical testing instrument 114 is desiredalong with interaction and observation by the instruments 104-110 itbecomes important to provide additional degrees of freedom to facilitatethe alignment of the mechanical testing instrument 114 with the samplestage surface 208. For instance, as shown in FIG. 13B, without movementof the mechanical testing instrument 114 (the mechanical testinginstrument as shown by the dashed lines when fixed) the recessing of thesample stage surface 208 would position at least the rotation and tiltstage assembly 206 in an intercepting configuration with the instrumentfootprint 1600. Stated another way, at least the rotation and tilt stageassembly 206 would collide with the instruments within the instrumentfootprint 1600 when the sample stage surface 208 is aligned with themechanical testing instrument 114 and positioned relative to theinstrument 108 for observation by the instrument.

By providing the linear stage actuator 210 (e.g., an X axis actuator)shown in FIG. 13A, one or more of the linear stage assembly 204 and thelinear stage assembly 210 of the mechanical testing instrument 114 maybe operated alone or together to position the sample stage surface 208and the mechanical testing instrument 114 to not only orient the samplestage surface 208 relative to the instrument 108 but also at the sametime align the sample stage surface 208 with the mechanical testinginstrument 114. This added flexibility (in addition to the Y axis linearmovement provided by the stage 1408) allows for the alignment of themechanical testing instrument 114 with the sample stage surface 208 insubstantially any orientation where the sample stage surface 208 isoriented with respect to any of the instruments 104-110, for instancewhile the sample stage surface 208 is rotated approximately 180 degreesfrom an upward direction and a downward direction where the downwarddirection is shown in FIG. 13B and the upward direction would be 180degrees opposite from the orientation shown in FIG. 13B.

Referring again to FIG. 13B, to maintain the orientation of the samplestage surface 208 within the localized coincidence region 222 andthereby avoid collision with the instruments formed by the instrumentfootprint 1600 the rotation and tilt stage assembly 206 is moved withthe linear stage assembly 204, for instance, with one or more of thestage actuators 300-304 while at the same time the mechanical testinginstrument 114 is moved as shown in FIG. 13B. Stated another way, themechanical testing instrument 114 is moved a first linear direction, forinstance, downwardly along the page as shown in FIG. 13B and therotation and tilt stage assembly 206 is moved upward relative to theinstrument 108 to align the sample stage surface 208 with the mechanicaltesting instrument 114 while at the same time orienting the sample stagesurface 208 within the working region of the instrument 108. Bycombining the linear translation of the sample stage surface 208, forinstance by the linear stage assembly 204, and the linear stage assembly210 of the mechanical testing instrument the overall translation of eachof the components such as the mechanical testing instrument 114 and thesample stage surface 208 is substantially minimized thereby maintainingthe rotation and tilt stage assembly 206 and the surface 208 safelywithin the instrument footprint 1600. The multiple degree of freedomsample stage 116 as well as the mechanical testing instrument 114 arethereby able in combination (or separately in the case of the multipledegree of the freedom sample stage 116 operated by itself) to therebyflexibly position the sample stage surface 208 in one or moreorientations within the localized coincidence region 222 withoutcolliding the sample stage surface 208 (or any of the stages describedherein) with any of the instruments shown by the instrument footprint1600 formed by the instruments 104-110 previously shown in FIG. 2.

The addition of the linear stage assembly 210 of the mechanical testinginstrument 114 provides enhanced flexibility to thereby enable thealignment of the mechanical testing instrument 114 with the sample stagesurface 208 in substantially any orientation of the sample stage surface208 relative to the instruments 104-110. Further, the provision of thelinear stage assembly 210 with the mechanical testing instrument 114provides enhanced flexibility to the overall system by minimizing theoverall translation needed for the rotation and tilt stage assembly 206while at the same time allowing for alignment of the mechanical testinginstrument 114 with the sample stage surface 208 as the sample on thesample stage is otherwise oriented within the working region of one ormore of the instruments 104-110.

Further, as shown herein, the combination of the linear stage assembly204 with the rotation and tilt stage assembly 206 provides a systemconfigured to move the sample stage surface 208 around the mechanicaltesting instrument 114. Stated another way, with a static (or movable)instrument 114 the rotation and tilt stage assembly 206 in combinationwith the linear stages of the assembly 204 ensures the sample stagesurface 208 is movable around at least the tip of the instrumentincluding, but not limited to, positions on either side of the tip(left, right, below and above), in front of the tip (e.g., with the endof the tip point orthogonal to the surface 208), and a near infinitevariety of positions therebetween. Conversely, the mechanical testinginstrument 114 is able to access and engage with the sample stagesurface 208 from a variety of angles according to the coordinatedoperation of one or more of the rotation and tilt stage assembly 206 andthe linear stage assembly 204 (and optionally, the stages associatedwith the mechanical testing instrument 114).

Positioning and Locking of a Sample Position with the Multiple Degree ofFreedom Sample Stage

As previously described above, the multiple degree of freedom samplestage 116 provides substantial flexibility for the positioning of thesample stage surface 208 and a sample thereon relative to one or more ofthe instruments 104-110 while at the same time allowing for access bythe mechanical testing instrument 114. The movable coupling of each ofthe stage platforms with respective stage bases for each of the stagesof the linear stage assembly 204 and the rotation and tilt assembly 206provides an opportunity to undesirably introduce tolerances to theoverall multiple degree of freedom sample stage 116. Such tolerancesinclude lateral displacement and tilting tolerances that allow movementof the sample stage surface 208 after or during positioning thatmisalign the sample stage surface 208 and the sample thereon relative toone or more of the instruments 104-110 and a mechanical testinginstrument 114. Tolerances frustrate the accurate and reliable testingof a desired testing location of the sample.

As previously described herein, one or more cross roller bearingassemblies 706 as well as the clamping assemblies as described herein,such as the clamping assembly 1100 for the rotation stage 600, theclamping assembly 1208 for the tilt stage 600, as well as the clampingprovided through the linear stages 210, 300, 302, 304 substantiallyminimizes any inaccuracies caused by tolerances and allows for theaccurate and reliable positioning of any sample on the sample stagesurface 208. Stated another way, even with the flexibility provided bythe multiple degree of freedom sample stage 116 robust supportingsurfaces, clamping and locking engagement, and the like are providedthroughout the multiple degree of freedom sample stage 116 to ensure asample on the sample stage surface 208, when positioned at a desiredposition, is accurately and reliably positioned at the desired positionand thereafter held or locked in that position despite actuation orinteraction with instruments such as the mechanical testing instrument114. That is to say, forces incident on the sample stage surface 208,for instance, from the mechanical testing instrument 114 engaged withthe sample stage surface 208 as well as environmental forces such asgravity incident on the stages of the multiple degree of freedom samplestage 116 have minimal effect on the positioning and retention of thesample stage surface 208 and the sample thereon relative to the desiredposition.

Referring now to FIG. 14, a schematic example of the multiple degree offreedom sample stage 116 is provided. As shown, the multiple degree offreedom sample stage 116 includes a linear stage assembly 204 and arotation and tilt stage assembly 206. As previously described, in oneexample, the linear stage assembly 204 includes a plurality of linearstages such as X, Y and Z stages 300-304. The linear stages 300-304allow for the linear positioning of the sample stage surface 208(including for instance, the rotation and tilt stage assembly 206) intoone or more translated orientations as previously described herein. Asshown in FIG. 14, in one example, each of the X, Y and Z stages 300-304includes corresponding cross roller bearing assemblies 706. As shown inFIG. 14, one cross roller bearing assembly is provided between each ofthe stage platforms and stage bases of each of the X, Y and Z stages300-304. In other examples and as shown herein, two or more cross rollerbearing assemblies 706 are provided for each of the X, Y and Z stages300-304 to provide enhanced support and minimize tolerances (e.g.,deflection, tilting and the like of the stage platforms relative to thestage bases).

As shown, each of the cross roller bearing assemblies 706 includes aplurality of roller bearings 908 positioned within the first and secondrail channels 900, 902. As previously described herein, the rollerbearings 908 provide surface to surface interfaces between the stagebases and stage platforms of each of the X, Y and Z stages 300-304. Theroller bearings 908 are provided in an alternately crossed configurationwithin the first and second rail channels 900, 902. As shown, forinstance in FIG. 7, the opposed pairs of interface surfaces, forinstance, 906A, 906B and 904A, 904B allow the stage platforms and stagebases to interface in surface to surface contact with the rollerbearings 908 therebetween. For instance, the rolling interfaces of theroller bearings 902 are received in planar contact along each of theinterface surfaces 904A, B and 906A, B to support and transmit forces,torques and the like through surface contact between the roller bearings908 and the opposed stage platforms and stage bases. This surface tosurface engagement between the stage platforms and the stage bases withthe intervening roller bearings 908 substantially prevents thedeflection or tilting of the stage platforms relative to the stage basesand thereby provides a robust supported interface between the stageplatforms and stage bases of each of the X, Y and Z stages 300-304. Therobust support at the same time allows for ready movement of the stageplatforms relative to the stage bases through guidance provided by thecross roller bearing assemblies 706 when translation of one or more ofthe stages (e.g., to orient the sample stage surface 208) is desired.

In the schematic example shown in FIG. 14, one or more forces such as aninstrument force 1700 and gravity 1704 are applied to the multipledegree of freedom sample stage 116 to illustrate the robust supportingfeatures of the sample stage 116 during operation. As shown in FIG. 14,the stages 300-304 and 600, 602 are oriented to position the samplestage surface 208 in a substantially orthogonal orientation relative tothe instrument shaft 406 and instrument tip 408 of the mechanicaltesting instrument 114. The engagement of the mechanical testinginstrument 114 with the sample stage surface 208 applies the instrumentforce 1700 including corresponding moments to the components of themultiple degree of freedom sample stage 116. To ensure the sample stagesurface 208 and the sample thereon are maintained in the desiredposition (e.g., to ensure accurate placement of the instrument tip 408at the desired testing location) the entire chain of components of themultiple degree of freedom sample stage 116 from the sample stagesurface 208 to the stage base 308A of the Y stage 302 must remainsubstantially static from the time positioning is finished through atleast the instrument testing procedure. As described below, thecomponents of the multiple degree of freedom sample stage 116 ensurethat the sample is accurately and precisely moved during positioning andreliably held in a static specified position and orientation (e.g.,locked, clamped, held in place, and the like) during interaction withthe mechanical testing instrument 114. Minimizing deflection of thesample and/or mechanical testing instrument 114 due to compliance in thestage and/or platform assembly reduces error and uncertainty in themechanical test procedure. Further the multiple degree of freedom samplestage reliably holds the sample in the desired position and orientationfor post-interaction observation of the sample, for instance, by one ormore of the instruments 104-110.

As shown in FIG. 14, the instrument force 1700 is applied to the samplestage surface 208. Optionally, the instrument force 1700 is applied inan opposed fashion, for instance during tensile testing. The clampingassemblies 1110 and 1208 for the respective rotation and tilt stages600, 602 clamp the components of the rotation and tilt stage assembly206 in the orientation shown in FIG. 14. For instance, as describedabove multiple points of contact are engaged with the spindle assembliesof each of the rotation and tilt stages 600, 602 to substantiallyprevent the movement of the spindles (e.g., stage platforms) relative tothe respective stage bases. The instrument force 1700 is therebytransmitted from the rotation and tilt stage assembly 206 to theadjacent Z stage 304 without moving the components of the rotations tiltstages 600, 602 from their respective static orientations.

As shown in FIG. 14, the instrument force 1702 is transmitted throughthe linear stage assembly 204 as described herein. The instrument force1702 is applied to the roller bearings 908 from the stage platform 312Bby surface to surface engagement of the first rail channel 900 with theroller bearings 908. The roller bearings 908 transmit the instrumentforce 1702 to the second rail channel 902 (e.g., to the opposedinterface surface as shown in FIG. 7). The instrument force 1702 isthereafter transmitted to the stage platform 310B of the X stage 300 andthrough the interface of the first rail channel 900 is transmitted tothe roller bearings 908 of the cross roller bearing assembly 706 of theX stage 300. The roller bearings 908 of the cross roller bearingassembly 706 transmit the instrument force 1702 to the opposed railchannel 902 of the stage base 310A of the X stage 300. As shown in FIG.14, the stage base 310A of the X stage 300 is coupled with the stageplatform 308B of the Y stage 302. As shown in FIG. 14, because the crossroller bearing assembly 706 is aligned with the vector of the instrumentforce 1700 as well as the transmitted instrument force 1702 the crossroller bearing assembly 706 provides minimal support to the Y stage 302against movement. Instead, the clamping or locking engagement providedby the linear stage 302 (e.g., with the actuator 301) previously shownin FIG. 3 statically fixes the stage platform 308B relative to the stagebase 308A. Accordingly, the instrument force 1700 including thetransmitted instrument force 1702 is transmitted through the multipledegree of freedom sample stage 116 through one or more of clamping andlocking assemblies that substantially prevent the movement of theassociated components and through surface to surface engagement betweenthe respective stage platforms and stage bases of each of the X, Y and Zstages 300-304 to provide robust supported engagement between therespective components that substantially prevents the movement of thecomponents relative to one another.

In another example, other forces (e.g., with different directionalvector components) are incident on the multiple degree of freedom samplestage 116. In one example, a force such as gravity 1704 and associatedmoments created by gravity are applied to one or more of the componentsof the multiple degree of freedom sample stage 116. Gravity incombination with interaction forces provided by the mechanical testingof the instrument 114 (e.g., indentation, scratching, or tensile forces)deflects components of other stages that provide tolerances. The robustsupporting features of each of the components of the multiple degree offreedom sample stage 116 substantially prevents the tilting ordeflection of the sample stage surface 208 even with the multipledegrees of freedom provided. For instance, as shown in FIG. 14, gravity1704 is indicated with an arrow applied through the rotation stage 600.As with the instrument force 1700, the force of gravity 1704 issimilarly applied to each of the components of the multiplied degree ofsample stage 116, for instance, each of the stage platforms and stagebases of respective stages 300-304 and 600, 602. For instance, gravityat each of the components is transmitted (e.g., a transmitted force ofgravity 1706) to one or more of the components from adjacent components.Obviously each of the components is subject to gravity individually aswell. For the purpose of this illustration gravity 1704 is only examinedas a force transmitted from one end to the other end of the stage 116.

As shown, for instance, in FIG. 14, the force of gravity 1704 isincident on the rotation stage 600. The force of gravity 1704 as well asthe associated force of gravity incident on the stage platform 312B ofthe Z stage 304 creates a corresponding moment to the multiple degree offreedom sample stage 116. The clamping or locking engagement of thelinear Z stage 304 (e.g., through the actuator 301) substantiallyprevents the movement of the stage platform 312B relative to the stagebase 312A. Stated another way, tilting, deflection and the like of anyof the components of the associated Z stage 304, for instance, by way ofgravity 1704 is substantially prevented by the clamping and reliablelocking of the stage platform relative to the stage base. Continuingdown the chain of components as shown in FIG. 14, the transmitted forceof gravity 1706 is transmitted through the cross roller bearing assembly706 associated with the X stage 300 for instance, by surface to surfacecontact between the first and second rail channels 900, 902 and theinterposing roller bearings 908. For instance, the transmitted force ofgravity 1706 is applied across the first rail channel 900 to thealternating crossed roller bearings 908 of the cross roller bearingassembly 706 associated with the X stage 300. The transmitted force ofgravity 1706 from the stage platform 310B is transmitted to the stagebase 310 by the engagement of the alternatingly cross roller bearings908 engaged along the interface surfaces of the second rail channel 902.As shown in FIG. 14, the transmitted force of gravity 1706 is therebyapplied to the second rail channel 902.

The force of gravity 1706 is thereafter applied to the Y stage 302, forinstance, the stage platform 308B. The transmitted gravity force 1706 isapplied to the alternating cross roller bearings 908 from the first railchannel 900. The transmitted force of gravity 1706 is transmitted acrossthe roller bearings 908 to the interface surfaces of the second railchannel 902. As shown in FIG. 14, the force of gravity 1704 as well asmoments resulting from gravity are substantially prevented fromgenerating deflection of the components of the multiple degree offreedom sample stage 116. Stated another way, the clamping or lockingfeatures associated with each of the linear stages 300-304 (e.g., theactuators 301) as well as the cross roller bearing assemblies 706substantially prevent the deflection of the components of the linearstage assembly 204. That is to say, with positioning of the sample stagesurface 208 and a sample thereon in a desired orientation and position,the application of forces such as from the mechanical testing instrument114 and environmental forces such as gravity (but also includingvibration, equipment movement and the like) generate substantially nodeflection, tilting and the like of any of the components of themultiple degree of freedom sample stage 116. Stated another way, thesample stage surface 208 and the sample thereon when positioned asdesired are substantially locked in that orientation and robustlysupported by the components of the multiple degree of freedom samplestage 116 to ensure a desired testing location of the sample is held ata desired location, for instance for interaction with the mechanicaltesting instrument 114 and one or more of the instruments 104-110.

Method for Positioning a Sample Within a Chamber of a Multi-InstrumentAssembly

FIG. 15 shows one example of a method 1800 for orienting a sample withina chamber of a multi-instrument assembly (such as a multi-instrumentmicroscope assembly) using the multiple degree of freedom sample stage116 described herein. In describing the method in 1800, reference ismade to one or more components, features, functions and the likepreviously described herein. Where convenient reference is made to thecomponents and features with reference numerals. The reference numeralsprovided are exemplary and are not exclusive. For instance, thefeatures, components, functions and the like described in the method1800 include the corresponding numbered elements other correspondingfeatures described herein (both numbered and unnumbered) as well astheir equivalents.'

At 1802, a sample is positioned on a sample stage surface such as thesample stage surface 208 shown in FIG. 2. At 1804, the sample on thesample stage surface 208 is oriented to the first orientation in thechamber such as a chamber 102 of the multi-instrument assembly 100 shownin FIG. 1. In the first orientation the sample on the sample stagesurface 208 is oriented with one or more working regions of one or moreinstruments, such as the instruments 104-110 within the chamber 102. Asdescribed herein, the working regions are formed at least, in part, bythe instrument axis and focal points 214-220 shown in FIG. 2 which inturn when consolidated form a composite localized coincidence region222. Orienting the sample on the sample stage surface 208 to the firstorientation in the chamber 102 coincident with one or more of theworking regions of one or more of the instruments 104-110 includespositioning and orienting the sample within the localized coincidenceregion 222 formed by the working regions. The sample on the sample stagesurface 208 in the first orientation is within the localized coincidenceregion 222. For instance, the sample on the sample stage surface 208 inone or more orientations within the localized coincidence region 222 iswithin a clustered space between one or more of the instruments 104-110shown in FIGS. 1 and 2, for instance.

Orienting the sample includes one or more of, for instance tilting atilt stage 602 coupled with the sample stage surface 608 at step 1806 orrotating a rotation stage 600 coupled with the sample stage surface 208at step 1808. In one example, orienting includes one or more of tiltingand rotation of the corresponding tilt stage 602 and the rotation stage600.

At 1810, the method 1800 includes reorienting the sample on the samplestage surface 208 to a second orientation in the chamber 102 coincidentwith one or more working regions of the one or more instruments 104-110.The second orientation is different from the first orientation (e.g., asecond orientation relative to the same instrument or a secondorientation directed toward a second instrument) in the sample. Thesecond orientation is within the localized coincidence region 222.Reorienting includes one or more of tilting the tilt stage 602 orrotating the rotation stage 600 as previously described herein. Inanother example, the method 1800 includes coupling a testing assemblyplatform, such as the platform 200 shown in FIG. 2 supporting the samplestage surface 208 and the rotation and tilt stages 600, 602, to amounting stage 101 of the multi-instrument assembly 100. The mountedtesting assembly 112 is recessed from the walls of the multi-instrumentassembly 100 as shown in FIG. 1. Stated another way, the testingassembly 112 is positioned centrally or in another example away from thewalls of the multi-instrument assembly to enhance the flexibility ofpositioning of the multiple degree of freedom sample stage 116 withrespect to one or more of the instruments 104-110 tightly clusteredaround the sample stage surface 208.

Several options for the method 1800 follow. In one example, orientingthe sample on the sample stage surface 208 to the first orientation andreorienting the sample to the second orientation including orienting thesample on the sample stage surface to the first orientation coincidentwith the first working region of a first instrument (such as one of theinstruments 104-110) of the one or more instruments having the one ormore working regions. Reorienting the sample on the sample stage surface208 includes orienting the sample on the sample stage surface 208 to thesecond orientation coincident with the first working region on the firstinstrument. Stated another way, in one example, orienting andreorienting includes adjusting the position and alignment of the sampleposition on the sample stage surface 208 (as well as the alignment ofthe sample stage surface 208) within the same working region of a singleinstrument. For instance, the sample stage surface and the samplethereon are positioned in one example orthogonal to the axis of thefirst instrument. In another example, the sample stage surface 208 andthe sample thereon are positioned in an alignment coincident with theaxis. That is to say, the axis of the instrument is directed along thesurface of the sample stage surface 208.

In another example, orienting the sample on the sample stage surface tothe first orientation includes orienting the sample of the sample stagesurface 208 to the first orientation coincident with the first workingregion of a first instrument of the one or more instruments 104-110having one or more working regions. Reorienting the sample on the samplestage surface 208 includes orienting the sample stage surface 208 andthe sample thereon to the second orientation coincident with a secondworking region of a second instrument, such as the instrument 106 of theone or more instruments 104-110 having one or more working regionsdifferent from the working region of the first instrument.

In still another example, at least one of orienting and reorienting thesample stage surface 208 includes linearly moving the sample stagesurface with one or more linear stages 300-304 coupled with the rotationand tilt stages. As described herein, in one example, the one or morelinear stages 300-304 are included in a linear stage assembly 204 shown,for instance, in FIG. 2. Optionally, the method 1800 including orientingand reorienting of the sample stage surface 208 includes constrainingmovement of the sample stage surface and one or more of the tilting androtation stages 602, 600 toward one or more of the instruments 104-110in the chamber 102 with linear translation of the one or more linearstages 300-304. For instance, the linear stages 300-304 are operated tomaintain the sample stage surface 208 within the localized coincidenceregion while also precluding collision with one or more of theinstrument 104-110. That is to say, the linear stages 300-304 maintainthe sample stage surface 208 in a substantially centralized locationaway from the instrument composite footprint 1600. Constraining movementof the sample stage surface 208 and one or more of the tilt and rotationstages 602, 600 includes moving a mechanical testing instrument 114, forinstance, with a linear stage actuator 210 in an opposed direction tothe linear translation of the one or more stages (as shown in FIG. 13B).The mechanical testing instrument 114 is configured to mechanicallyinteract with a sample of a sample stage surface in one or more of thefirst and second orientations.

In yet another example, linearly moving the sample stage surface 208includes moving a stage platform (e.g., one or more of 308B, 310B, 312B)relative to a stage base (one or more of 308A, 310A, 312A) with anactuator 301. The actuators 301 include, but are not limited to, piezomotors, stepper motors, voice coil actuators, stick-slip actuators andthe like. Optionally, the method 1800 includes clamping one or more ofthe stage platforms relative to the respective stage bases (e.g., of oneor more of the linear stages 300, 302, 304) with a clamping or lockingfeature operated by the actuator 301.

In still other examples, the method 1800 including, for instance,orienting and reorienting of the sample stage surface 208 includesmoving a mechanical testing instrument 114 into alignment with thesample on the sample stage surface 208 in at least the first and secondorientations. For instance, moving the mechanical testing instrument 114includes operating a linear stage actuator (e.g., one or more of a X, Yor Z axis linear stage actuator 210) coupled with the mechanical testinginstrument 114. As described herein, moving the mechanical testinginstrument 114 in combination with orientation of the sample stagesurface 208 (e.g., orienting the sample stage surface in one or moredisparate orientations through linear translation, rotation and tiltingof the sample stage surface 208) allows for alignment of the mechanicaltesting instrument with the sample stage surface in substantially anyorientation relative to the instruments 104-110 while at the same timeminimizing the overall movement of the sample stage surface 208.Minimizing the overall movement (especially translation) of the samplestage surface 208 correspondingly minimizes any opportunity forcollision of the multiple degree of freedom the sample stage 116 withone or more of the instruments 104-110 tightly clustered around thestage 116.

Optionally, one or more of tilting the tilt stage 602 or rotating therotation stage 600 includes actuating first motor elements 1104A ofmotors (for instance, of motors 1102A-C) in a first direction whereinthe motors include the first motor element 1104A and a second motorelement 1104B. Actuating of the first motor elements 1104A of the motors1102A, 1102B (and optionally, 1102C) includes simultaneous actuation ofthe first motor element 1104A of the first motor 1102A and of the firstmotor element 1104A of the second motor 1102B to rotate the rotationstage platform in the first direction relative to the rotation stagebase (e.g., 1108B relative to 1108A). Similarly, through operation ofthe first motor elements 1204A of the first and second motors 1202A,1202B the tilt stage platform 1010B is rotated relative to the tiltstage base 1010A as shown in FIG. 10A.

Similarly, one or more of tilting of the tilt stage or rotating of therotation stage 600, 602 includes actuating second motor elements, forinstance second motor elements 1204B of the motors 1202A, 1202B, in asecond direction opposed to the first direction. Actuating of the secondmotor elements 1204B, 1204B of the motors 1202A, 1202B includessimultaneous actuation of the second motor element of the first motor1202A and the second motor element of the second motor 1202B to rotatethe tilt stage platform 1010B in a second direction relative to the tiltstage base 1010A. Referring to FIG. 9, actuation of the second motorelements 1104B of at least two of the motors 1102A-C, for instance, bysimultaneous actuation of the second motor elements 1104B moves therotation stage platform 1010B relative to the rotation stage base 1008A.

Method for Locking a Stare of Stage Assembly

FIG. 16 shows one example of the method 1900 for locking a stage of asample stage assembly in an orientation (e.g., in an orientation orposition as previously described herein). In describing the method 1900reference is made to one or more components, features, functions and thelike previously described herein. Where convenient reference is made tothe components and features with reference numerals. The referencenumerals provided are exemplary and are not exclusive. For instance, thefeatures, components, functions and the like described in the method1900 include the corresponding numbered elements, other correspondingfeatures described herein, as well as their equivalents.

At 1902, a stage platform is moved relative to a stage base with atleast one motor. For instance, as described herein, multiple linear,rotation and tilt stages 300-304, 600, 602 are described. Each of thestages includes respective stage platforms and stage bases. As describedherein, one or more motors are operated to move the stage platformsrelative to the stage bases. At 1904, the method 1900 includes arrestingmotion of the stage platform relative to its respective stage base.Optionally, the method 1900 includes moving the testing assembly 112,for instance by operation of actuators associated with themulti-instrument assembly 100. Actuation by the assembly 100, forinstance transmitted through the interface of the mounting stage 101with the testing assembly mount 202 provides additional flexibility formovement of the stage platform (e.g., the sample stage surface 208).

At 1906, the method 1900 includes statically clamping the stage platformrelative to the stage base. For instance, examples of clampingassemblies are shown in FIGS. 9 and 10A including clamp assemblies 1110and 1208. Respective stage platforms 1008B and 1010B are shown in FIGS.9 and 10A and corresponding stage bases 1008A and 1010A are shown inFIGS. 9 and 10A as well. Static clamping includes one or more of thefollowing. At 1908, a clamping surface and the at least one motor arebiased together, for instance, by operation, of one or more actuators,springs and the like as described herein. At 1910, the stage platform isengaged between the clamping surface and the at least one motor. In oneexample, the clamping surface is shown in FIG. 9 by at least one portionof the rotational bearing 1014. Another example of a clamping surface isshown in FIG. 10A by the axle 1200 (see also FIG. 10B a cross-sectionalview of the tilt spindle assembly 1020 including the axle 1200 extendingtherethrough). Examples of motors are similarly provided in FIGS. 9 and10A corresponding to features 1102A-1102C and 1202A, 1202B,respectively.

In one example, the at least one motor described in the method 1900includes a piezo motor configured to provide at least one waydirectional movement of the stage platform relative to the stage base.For instance, as shown in FIG. 9 the motors 1102A-C each includeseparate motor elements 1104A, 1104B (first and second motor elements)configured to provide rotational movement in opposed first and seconddirections. In one example, arresting motion of the stage platform suchas stage platform 1008B relative to the stage base 1008A includesrelaxing the at least one motor, for instance, each of the motorelements 1104A, 1104B. In another example, the method 1900 incorporatesarresting motion of the stage platform, for instance, by relaxation ofthe at least one motor with clamping of the stage platform 1008Brelative to the stage base 1008A. Optionally, as previously describedherein the relaxation of one or more of the motor elements 1104A, 1104Bof each of the motors 1102A, 1102C (or their counterparts in the tiltstage 602) automatically initiates static clamping of the stage platform1008B relative to the stage base 1008A.

Several options for the method 1900 follow. In one example, biasing theclamping surface and the at least one motor together includes biasing atleast one motor such as one or more of the motors 1102A, 1102C with atleast one biasing element 1114A, 1114B coupled with the at least onemotor. The at least one motor 1102A-C is biased toward the clampingsurface such as a portion of the rotational bearing 1014. In anotherexample, as shown in FIG. 10A the biasing elements 1212A, 1212B (shownin FIG. 10B) bias the motors 1202A, 1202B toward the clamping surfacesuch as the axle 1200. In another example, biasing the at least onemotor includes applying a first bias to a first motor element, such asthe motor element 1104A shown in FIG. 9 of at least one of the motors1102A, with a first spring element 1114A of the at least one biasingelement. A second bias is applied to a second motor element, such as themotor element 1104B of the at least one motor 1102A, with a secondspring element 1114B of the at least one biasing element wherein thefirst motor element 1104A is configured to move the stage platform in afirst direction and the second motor element 1104B is configured to movethe stage platform in a second direction, for instance, opposed to thefirst direction. Optionally, moving the stage platform such as the stageplatform 1008B or 1010B relative to the respective stage bases includesmoving one or more drive shoes, such as the drive shoes 1106, 1206 shownin FIGS. 9, 10A, with one or more of the first and second motor elementspreviously described herein. As shown in the figures, the drive shoes1106, 1206 are respectively coupled between the first and second motorelements of each of the motors.

In still another example, the method 1900 further includes constraininglateral deflection of the at least one biasing element such as thebiasing elements 1212A, 1212B shown in FIGS. 10A, 10B with at least onelateral support biasing element 1214A, 1214B. The at least one lateralsupport biasing element 1214A, 1214B is coupled with the at least onebiasing element 1212A, 1212B. Optionally, the lateral support biasingelements are coupled with the biasing elements with an interveningstructure, such as the motor support saddle 1206 shown in FIG. 10A.

Referring now to FIG. 9, in one example, biasing the clamping surfaceand the at least one motor together includes biasing at least one motor(for instance, three motors 1102A-1102C) positioned around the stageplatform 1008B toward a first surface of the stage platform, forinstance, a surface of the stage platform engaged with one or more ofthe drive shoes 1106 as shown in FIG. 9. Engaging the stage platform1008B includes engaging the one or more motors 1102A-C with the firstsurface and engaging the clamping surface (for instance, a portion ofthe rotational bearing 1014 shown in FIG. 10A) with a second surface ofthe stage platform opposed to the first surface. In one example, thestage platform 1008B includes a rotation flange 1100 associated with thestage platform 1008B, and the rotation flange 1100 includes the firstand second opposed surfaces as shown in FIG. 9. For instance, as shownthe first and second surfaces of the rotation flange 1100 are shownrespectively engaged with the drive shoes 1106 and a portion of therotational bearing 1014.

In still yet another example, biasing the clamping surface and the atleast one motor together includes biasing at least two motors 1202A,1202B spaced around the stage platform 1010B toward a first surface ofthe stage platform such as an outer perimeter of a tilt spindle 1020shown in FIGS. 10A and 10B. Similarly, engaging the stage platform 1010Bincludes engaging the at least two motors 1202A, B with the firstsurface such as the outer perimeter surface of the tilt spindle 1020 andengaging the clamping surface such as the axle 1200 with the secondsurface of the stage platform opposed to the first surface. Forinstance, as shown in FIG. 10B, the axle 1200 is engaged with an innerperimeter surface of the tilt spindle 1020. As shown in FIG. 10B, thetilt spindle 1020 is a portion of the tilt stage platform 1010B andincludes the first surface extending along an outer perimeter of thetilt spindle and the second surface extending along an inner perimeterof the tilt spindle.

Operation of a Cross Roller Bearing Assembly

FIG. 17 shows one example of a method 2000 for using a multiple degreeof freedom sample stage, such as the sample stage 116 shown in FIGS. 1and 2. In describing the method 2000, reference is made to one or morecomponents, features, functions, and the like previously describedherein. Where convenient reference is made to the components andfeatures with reference numerals. Reference numerals provided areexemplary and are not exclusive. For instance, the features, components,functions, and the like described in the method 2000 include thecorresponding numbered elements, other corresponding features describedherein (both numbered and unnumbered) as well as their equivalents.

At 2002, the method 2000 includes actuating one or more linear stages300-304 of a plurality of linear stages coupled with a sample stagesurface 208. The one or more linear stages 300-304 each include a stageplatform moveably coupled with a stage base along respective linear axes(e.g., x, y, and z axes). Actuating includes moving at least one stageplatform relative to the at least one stage base along the respectivelinear axis for one or more of the linear stages 300-304. As shown, forinstance, in FIG. 3, each of the linear stages 300-304 each includecorresponding stage bases 308A, 310A, 312A and stage platforms 308B,310B, 312B. Each of the stage platforms are movable with respect to thecorresponding stage bases of the associated linear stages 300-304, forinstance with actuators 301 associate with each of the stages.Optionally, actuating the one or more linear stages 300-304 includesaligning the sample stage surface 208 with one or more instrumentsincluding a mechanical testing instrument 114.

At 2004, the method 2000 further includes constraining lateraltranslation and tilting of the stage platforms relative to therespective stage bases of the plurality of linear stages 300-304 andrelative to the linear axis of each of the stages with cross rollerbearing assemblies 706 interposed between one or more of the stageplatforms and the stage bases. As described herein, the cross rollerbearing assemblies 706 include a plurality of cylindrical bearings(e.g., roller bearings 908) in an alternating crossed configuration. Forinstance, each adjacent roller bearing 908 within a cross roller bearingassembly 706 is at a right angle relative to the adjacent rollerbearings on either side of that bearing.

Referring now to FIG. 7, in one example constraining lateral translationand tilting of the stage platforms included engaging platform planarinterface surfaces that of 904A, 906B (of the rail channel 900) withcylindrical bearing surfaces of the plurality of cylindrical bearings908, (e.g., cylindrical bearing surfaces 910 shown in FIG. 7). Further,constraining lateral translation and tilting includes engaging baseplanar interface surfaces of the stage base, such as 906A, 904B (of therail channel 902) with the cylindrical bearing surfaces 910 of theplurality of cylindrical bearings 908. In another example, constraininglateral translation and tilting includes engaging opposed pairs ofplatform and base planar interface surfaces with cylindrical bearingsurfaces of the plurality of cylindrical bearings 908. For instance, afirst array of cylindrical bearing surfaces 910, for instance, acylindrical bearing oriented in a first direction (see the left bearing908 shown in FIG. 7) are engaged with a first pair of the opposed pairsof platform and base planar interface surfaces 904A-904B. Similarly, asecond array of cylindrical bearing surfaces 910 are engaged with asecond pair of the opposed pairs of platform and base planar interfacesurfaces, such as the surfaces 904A, 904B as shown with the rightbearing 908 in FIG. 7.

As previously described herein, each of the rail channels 900, 902containing a plurality of roller bearings 908 therein includes rollerbearings in an alternating crossed relationship. For instance, aspreviously described herein, the roller bearing 908 as shown in FIG. 7includes its cylindrical bearing surface 910 engaged with each of thepair of opposed interface surfaces 904A, 904B. A preceding or succeedingroller bearing 908 within the rail channels 900, 902 includes a secondarray of cylindrical bearing surfaces 910 engaged with the second pairof the opposed pairs of platform and base planar interface surfaces suchas the interface surfaces 906A, 906B. As shown in FIG. 7, the first pairof interface surfaces 904A, 904B are at an angle to the second pair ofinterface surfaces 906A, 906B corresponding to the alternating crossedconfiguration of the cylindrical bearings. Stated another way, the railchannels 900, 902 of each of the stage platforms and stage bases includeopposed interface surfaces 904A, 904B and 906A, 906B sized and shaped toengage surface to surface contact with corresponding cylindrical bearingsurfaces 910 of each of the plurality of roller bearings 908.

Several options for the method 2000 follow. In one example, constraininglateral translation and tilting further includes guiding the movement ofat least one of the stage platforms, such as stage platform 310B shownin FIG. 7, relative to at least of the respective stage bases 310A alongthe respective linear axis of one of the linear stages of the pluralityof linear stages 300-304 with one of the cross roller bearer assemblies706. As described herein, the cross roller bearing assemblies 706substantially prevent or constrain the lateral translation and tiltingof the stage platforms relative to the respective stage bases where thetranslation and tilting are not coincident with the stage linear axis.The cross roller bearing assemblies 706 thereby provide a solidcontinuous chain of surface-to-surface engagement from the sample stagesurface 208 throughout the multiple degree of freedom sample stage 116.Additionally, the cross roller bearing assembly 706 ensure thattranslation of the stage platforms, such as the stage platforms 308B,310B, 312B are constrained to move along the respective linear axes ofthe respective linear stages 300-304 according to the interfacingrelationship of the roller bearings 908 within the assembly 706 as theyare correspondingly movably engaged with the respective stage bases308A, 310A, 312A. The cross roller bearing assemblies 706 therebysubstantially prevent deflection and tilting of the linear stages300-304 while at the same time the cross roller bearing assemblies 706accurately and reliably guide the translation of the plurality of stageplatforms relative to the respective stage bases along the desiredlinear axes.

In yet another example, actuating the one or more linear stages 300-304includes moving one or more of the stage platforms 308B, 310B, 312Brelative to the respective stage bases, for instance with actuators 301associated with each of the stages 300-304. In one example, theactuators 301 include, but are not limited to, piezo motors, steppermotors, voice coil actuators, stick-slip actuators and the like.

In still another example, the method 2000 includes aligning the samplestage surface 208 with one or more instruments such as the mechanicaltesting instrument 114 with the actuation of one or more of the linearstages 300-304 of the linear stage assembly 204 previously shown inFIGS. 2 and 3. Optionally, aligning the sample stage surface with one ormore instruments 114 includes one or more of rotating or tilting thesample stage surface 208 with one or more rotation or tilt stages 600,602 coupled with the plurality of linear stages 300-304. For instance,the rotation or tilt stages 600, 602 are incorporated into a rotationand tilt stage assembly 206 that is coupled in series with the pluralityof linear stages and the linear stage assembly 204.

Conclusion

The apparatus and methods described herein provide a system configuredfor positioning a sample for observation and mechanical interaction andtesting within a compact chamber of an instrument housing. The chamberof such an instrument housing includes a series of instruments anddetectors (e.g., FIB instruments, one or more electron back scatterdetectors (EBSD), an electron gun for a scanning electron microscope andthe like) tightly clustered around a centralized testing location aswell as the physical boundaries of the instrument housing walls.

The testing assembly apparatus and methods described herein allow forflexible maneuvering of the sample within the tight cluster ofinstruments by with the multiple degree of freedom sample stage. Thetesting assembly uses a multiple degree of freedom sample stageincluding linear, rotation and tilt stages to accurately, reliably andquickly position and reposition a sample within the chamber according tothe testing parameters (e.g., working regions, such as focal points,instrument ranges and the like) of each of the instruments usedsuccessively or at the same time. Further, the positioning and orientingof the sample occurs within the centralized location (localizedcoincidence region) of the compact chamber surrounded by the clusteredinstruments and the detectors. The combination of rotation, tilt andlinear positioning facilitates the orienting and positioning of a sampleat the centralized location according to the working regions of the oneor more instruments. Moreover, the positioning and repositioning of thesample is performed without opening of the chamber and manualrepositioning.

In another example, the testing assembly includes one or more stagescoupled with a mechanical testing instrument (e.g., a transducerincluding an indentation, scratch tip, tensile grips or the like) toprovide at least one additional degree of freedom to the testingassembly. For instance, a sample that is tilted and rotated to directthe sample toward a first instrument is retained in close proximity tothe centralized location of the compact chamber defined by the focalpoints or working distances (e.g., the working regions) of the one ormore instruments and detectors as well as their physical housings. Themechanical testing instrument is similarly positionable relative to thesample to mechanically test the sample. The testing assembly therebypositions and orients the sample according to the parameters of each ofthe instruments originally present within the compact chamber of theinstrument housing while at the same time positioning a mechanicaltesting instrument to interact with the sample. Moving the mechanicaltesting instrument maintains the sample in the desired orientation ofthe instruments and detectors, allows for their use and also allows forcontemporaneous mechanical testing of the sample.

As described herein, the multiple degree of freedom sample stage (and insome examples the mechanical testing instrument) allows for thepositioning and orienting of a sample within a centralized location(e.g., localized coincidence region) of the compact chamber andsubstantially prevents impingement or collision of the multiple degreeof freedom sample stage with the instruments and detectors tightlyclustered around the centralized location.

Moreover, the testing apparatus, for instance the linear stage assemblyincluding one or more of X, Y and Z stages includes one or more bearingassemblies with substantially rigid lateral support and linear guidancemechanisms. In one example, the one or more bearing assemblies include,but are not limited to, cross roller bearing assemblies for one or moreof the linear stages that provide a solid structural interface betweeneach stage platform and stage base. The surface to surface engagementbetween the cylindrical bearing surfaces and the opposed interfacesurfaces substantially eliminates relative movement of the components ofeach linear stage along axes not coincident with the linear axes of therespective stages. Additionally, one or more of the rotation and tiltstages includes clamping assemblies that affirmatively hold the stageplatform of each actuator static relative to the respective stage base.The clamping assemblies bias the stage platform into engagement with thestage base with multiple points of contact to tightly hold the stageplatform in the desired position. Even with engagement by the mechanicaltesting instrument with the sample (e.g., indenting, scratching, tensileloading and the like) and corresponding transmission of forces to themultiple degree of freedom sample stage, the sample is reliably held inthe desired position and orientation for testing and observation. Themultiple degree of freedom stage is thereby able to provide theflexibility of the linear, tilt and rotation positioning without thecompounded tolerances provided in other multiple degree of freedomassemblies.

Various Notes & Examples

Example 1 can include subject matter such as an apparatus, such as caninclude a testing assembly configured for operation within a chamber ofa multi-instrument assembly, each instrument of the multi-instrumentassembly includes a working region, the working regions defining alocalized coincidence region, the testing assembly comprising: a testingassembly platform configured for coupling with a mounting stage of themulti-instrument assembly; a mechanical testing instrument coupled withthe testing assembly platform, the mechanical testing instrument isconfigured to engage and test a sample on a sample stage surface; amultiple degree of freedom sample stage assembly coupled with thetesting assembly platform, the multiple degree of freedom sample stageincludes: the sample stage surface, a plurality of linear stages coupledin series with the testing assembly platform, a rotation stage, and atilt stage, wherein the rotation and tilt stages are coupled in seriesand are coupled between the sample stage surface and the plurality oflinear actuators; and wherein the multiple degree of freedom samplestage is configured to orient the sample stage surface to each of theworking regions in the localized coincidence region through acombination of movement of two or more of the plurality of linear,rotation and tilt stages.

Example 2 can include, or can optionally be combined with the subjectmatter of Example 1, to optionally include wherein the rotation stageincludes a rotation stage platform movably coupled with a rotation stagebase, and the tilt stage includes a tilt stage platform movably coupledwith a tilt stage base.

Example 3 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 or 2 to optionallyinclude comprising a rotation and tilt assembly including the rotationand tilt stages, wherein the rotation and tilt assembly is coupled withthe plurality of linear stages, and the rotation and tilt assemblyincludes: the rotation stage base coupled with the plurality of linearstages, a rotation spindle movably coupled with the rotation stage base,and the rotation spindle includes the rotation stage platform and thetilt stage base, and a tilt spindle movably coupled with the rotationspindle.

Example 4 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 3 to optionallyinclude wherein the rotation stage base surrounds the tilt stage base.

Example 5 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 4 to optionallyinclude wherein the rotation stage includes one or more motorsinterposed between the rotation stage platform and the rotation stagebase, and the one or more motors are biased into direct or indirectengagement with one or more of the rotation stage platform or base.

Example 6 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 6 to optionallyinclude wherein the tilt stage includes one or more motors interposedbetween the tilt stage platform and the tilt stage base, and the one ormore motors are biased into direct or indirect engagement with one ormore of the tilt stage platform or base.

Example 7 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 6 to optionallyinclude wherein at least one of the rotation stage and the tilt stageincludes one or more motors, and each of the one or more motorsincludes: a first motor element configured to move one of the rotationstage platform or the tilt stage platform in a first direction relativeto the respective rotation stage base or the tilt stage base, a secondmotor element configured to move one of the rotation stage platform orthe tilt stage platform in second direction relative to the respectiverotation stage base or the tilt stage base, wherein the second directionis opposed to the first direction, and a drive shoe coupled between thefirst and second motor elements, the drive shoe is movably engaged withone of the rotation or tilt stage platforms or the rotation or tiltstage bases.

Example 8 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 7 to optionallyinclude wherein the rotation and tilt stages are positioned at an end ofthe plurality of linear stages remote from the location of couplingbetween the testing assembly platform and the plurality of linearstages, and rotation and tilting of the sample stage surface islocalized near the end of the plurality of linear stages.

Example 9 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 8 to optionallyinclude wherein the multiple degree of freedom sample stage assembly isisolated from walls of a chamber of a multi-instrument assembly.

Example 10 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 9 to optionallyinclude wherein the tilt stage includes a tilting range of motion, andthe rotation stage includes a rotation range of motion, and the tilt androtation stages are movable throughout the respective tilting androtation ranges of motion while the sample stage surface is oriented toeach of the working regions in the localized coincidence region.

Example 11 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 10 to optionallyinclude wherein the tilting range of motion is around 180 degrees, andthe rotation range of motion is around 180 degrees.

Example 12 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 11 to optionallyinclude wherein at least one linear stage of the plurality of linearstages includes a stage platform movably coupled with a stage base.

Example 13 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 12 to optionallyinclude wherein the stage platform of a first stage of the plurality oflinear stages is included in the stage base of a second stage of thelinear stages.

Example 14 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 13 to optionallyinclude wherein at least one cross roller bearing assembly is coupledbetween the stage platform and the stage base of one or more of theplurality of linear stages.

Example 15 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1-14 to include, subjectmatter such as a method, such as can include positioning a sample on asample stage surface; orienting the sample on the sample stage surfaceto a first orientation in the chamber coincident with one or moreworking regions of one or more instruments within the chamber includinga mechanical testing instrument, the one or more working regions definea localized coincidence region within the chamber, and the sample in thefirst orientation is within the localized coincidence region, orientingincludes one or more of: tilting a tilt stage coupled with the samplestage surface, or rotating a rotation stage coupled with the samplestage surface; and reorienting the sample on the sample stage surface toa second orientation in the chamber coincident with one or more workingregions of the one or more instruments, the second orientation isdifferent from the first orientation, and the sample in the secondorientation is within the localized coincidence region, reorientingincludes one or more of tilting the tilt stage or rotating the rotationstage.

Example 16 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 15 to optionallyinclude, wherein orienting the sample on the sample stage surface to thefirst orientation and reorienting the sample on the sample stage surfaceto the second orientation respectively include: orienting the sample onthe sample stage surface to the first orientation coincident with afirst working region of a first instrument of the one or moreinstruments having the one or more working regions, and reorienting thesample on the sample stage surface to the second orientation coincidentwith the first working region of the first instrument.

Example 17 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 16 to optionallyinclude wherein orienting the sample on the sample stage surface to thefirst orientation and reorienting the sample on the sample stage surfaceto the second orientation respectively include: orienting the sample onthe sample stage surface to the first orientation coincident with afirst working region of a first instrument of the one or moreinstruments having one or more working regions, and reorienting thesample on the sample stage surface to the second orientation coincidentwith a second working region of a second instrument of the one or moreinstruments having one or more working regions.

Example 18 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 17 to optionallyinclude wherein at least one of orienting and reorienting includeslinearly moving the sample stage surface with one or more linear stagescoupled with one or more of the rotation and tilt stages.

Example 19 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 18 to optionallyinclude wherein orienting and reorienting includes constraining movementof the sample stage surface and one or more of the tilt and rotationstages toward one or more of the instruments in the chamber with lineartranslation of the one or more linear stages.

Example 20 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 19 to optionallyinclude wherein constraining movement of the sample stage surface andone or more of the tilt and rotation stages includes moving themechanical testing instrument in an opposed direction to the lineartranslation of the one or more linear stages, the mechanical testinginstrument is configured to mechanically interact with a sample on thesample stage surface.

Example 21 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 20 to optionallyinclude wherein orienting the sample on the sample stage surface to thefirst orientation includes one or more of: tilting a tilt stage coupledwith the sample stage surface, or rotating a rotation stage coupled withthe sample stage surface, and rotating the sample stage surface around asample surface rotational axis extending through the sample stagesurface; and reorienting the sample on the sample stage surface to thesecond orientation includes one or more of tilting the tilt stage orrotating the rotation stage, and rotating the rotation stage coupledwith the sample stage surface.

Example 22 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 21 to optionallyinclude wherein at least one of orienting and reorienting includesmoving the mechanical testing instrument into alignment with the sampleon the sample stage surface in at least the first and secondorientations.

Example 23 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 22 to optionallyinclude wherein moving the mechanical testing instrument includesoperating a linear stage actuator coupled with the mechanical testinginstrument.

Example 24 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 23 to optionallyinclude coupling a testing assembly platform including the sample stagesurface and the rotation and tilt stages to a mounting stage of themulti-instrument assembly, and the mounted testing assembly platform isrecessed from walls of the multi-instrument assembly.

Example 25 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 24 to optionallyinclude wherein one or more of tilting the tilt stage or rotating therotation stage includes: actuating a first motor element of a firstmotor in a first direction, wherein the first motor includes the firstmotor element and a second motor element, actuating a first motorelement of a second motor in the first direction, wherein the secondmotor includes the first motor element and a second motor element, andwherein actuation of the first motor element of the first motor issimultaneous with actuation of the first motor element of the secondmotor to rotate in the first direction one or more of the tilt stageplatform relative to the tilt stage base or the rotation stage platformrelative to the rotation stage base.

Example 26 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 25 to optionallyinclude wherein one or more of tilting of the tilt stage or rotating ofthe rotation stage includes: actuating the second motor element of thefirst motor in a second direction, wherein the second direction isopposed to the first direction, actuating the second motor element ofthe second motor in the second direction, and wherein actuation of thesecond motor element of the first motor is simultaneous with actuationof the second motor element of the second motor to rotate in the seconddirection one or more of the tilt stage platform relative to the tiltstage base or the rotation stage platform relative to the rotation stagebase.

Example 27 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 26 to optionallyinclude wherein at least one of orienting and reorienting includeslinearly translating the sample stage surface with one or more linearstages coupled with one or more of the rotation and tilt stages.

Example 28 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1-27 to include, subjectmatter such as an apparatus, such as can include a rotation stage; atilt stage coupled with the rotation stage; a sample stage surfacecoupled with one of the rotation stage or the tilt stage; and whereinone or both of the rotation and tilt stages includes: a stage base, astage platform coupled with the stage base, and at least one motormovably coupled with one of the stage base or the stage platform, the atleast one motor is configured to move the stage platform relative to thestage base; and wherein one or both of the rotation and tilt stagesincludes a clamping assembly, the clamping assembly comprising: aclamping surface extending along the stage platform, and at least onebiasing element coupled with at least one of the motor and the clampingsurface, wherein the at least one biasing element biases one or more ofthe motor and the clamping surface together, and the clamping surfaceand the motor clamp the stage platform therebetween.

Example 29 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 28 to optionallyinclude wherein the at least one motor includes at least one piezomotor.

Example 30 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 29 to optionallyinclude wherein the at least one biasing element includes a first springand a second spring, and the at least one motor is positioned betweenthe first and second springs.

Example 31 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 30 to optionallyinclude wherein the at least one motor includes: a first motor elementconfigured to move the stage platform in a first direction relative tothe stage base, a second motor element configured to move the stageplatform in a second direction relative to the stage base, wherein thesecond direction is opposed to the first direction, and a drive shoecoupled between the first and second motor elements, the drive shoe ismovably engaged with one of the stage platform or the stage base.

Example 32 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 31 to optionallyinclude wherein the at least one biasing element includes one or moresprings, wherein the first and second motor elements are interposedbetween first and second spring contact points.

Example 33 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 32 to optionallyinclude wherein the at least one motor includes at least two motorsinterposed between the stage platform and the stage base.

Example 34 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 33 to optionallyinclude wherein the rotation stage includes: at least three motorsspaced around the stage platform and movably coupled with a firstsurface of the stage platform, and the clamping surface is movablycoupled along a second surface of the stage platform, the second surfaceis opposed to the first surface, and in a clamping configuration the atleast three motors are engaged along the first surface and the clampingsurface is engaged along the second surface.

Example 35 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 34 to optionallyinclude wherein the stage platform includes a rotation flange extendingaround a perimeter of the stage platform, the rotation flange includesthe first and second opposed surfaces, and the rotation flange isinterposed between the clamping surface and the at least three motors.

Example 36 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 35 to optionallyinclude wherein the tilt stage includes: at least two motors spacedaround the stage platform and movably coupled with a first surface ofthe stage platform, and the clamping surface is movably coupled along asecond surface of the stage platform, wherein the second surface isopposed to the first surface.

Example 37 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 36 to optionallyinclude wherein the stage platform includes a tilt spindle including thefirst surface and the second surface, the first surface extends along anouter perimeter of the tilt spindle and the second surface extends alongan inner perimeter of the tilt spindle, and in a clamping configurationthe clamping surface is engaged along the second surface and the atleast two motors are engaged along the first surface.

Example 38 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 37 to optionallyinclude wherein the clamping surface includes an axle extending throughthe tilt spindle.

Example 39 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 38 to optionallyinclude one or more lateral support biasing elements coupled with the atleast one biasing element, and the one or more lateral support biasingelements constrains lateral deflection of the at least one biasingelement.

Example 40 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 39 to optionallyinclude wherein the at least one biasing element is coupled with themotor, and the at least one biasing element biases the motor toward theclamping surface with the stage platform therebetween.

Example 41 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 40 to optionallyinclude one or more linear stages coupled with at least one of therotation and tilt stages.

Example 42 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 41 to optionallyinclude wherein the one or more linear stages includes a plurality oflinear stages coupled in series with each other.

Example 43 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 42 to optionallyinclude a testing assembly base coupled with the one or more linearstages.

Example 44 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 43 to optionallyinclude wherein the tilt stage is directly coupled with the rotationstage, and the rotation stage is directly coupled with the one or morelinear stages.

Example 45 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1-44 to include, subjectmatter such as a method, such as can include moving a stage platformrelative to a stage base with at least one motor; arresting motion ofthe stage platform; and statically clamping the stage platform relativeto the stage base, wherein statically clamping includes: biasing aclamping surface and the at least one motor together, and engaging thestage platform between the clamping surface and the at least one motor.

Example 46 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 45 to optionallyinclude wherein arresting motion of the stage platform includes relaxingthe at least one motor.

Example 47 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 46 to optionallyinclude wherein arresting motion of the stage platform automaticallyinitiates static clamping of the stage platform.

Example 48 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 47 to optionallyinclude wherein biasing the clamping surface and the at least one motortogether includes biasing the at least one motor with at least onebiasing element coupled with the at least one motor, and the at leastone motor is biased toward the clamping surface.

Example 49 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 48 to optionallyinclude wherein biasing the at least one motor includes: applying afirst bias to a first motor element of the at least one motor with afirst spring element of the at least one biasing element, and applying asecond bias to a second motor element of the at least one motor with asecond spring element of the at least one biasing element, wherein thefirst motor element is configured to move the stage platform in a firstdirection, and the second motor element is configured to move the stageplatform in a second direction.

Example 50 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 49 to optionallyinclude wherein moving the stage platform includes moving a drive shoewith one or more of first and second motor elements of the at least onemotor, and the drive shoe is coupled between the first and second motorelements.

Example 51 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 50 to optionallyinclude constraining lateral deflection of the at least one biasingelement with at least one lateral support biasing element, wherein theat least one lateral support biasing element is coupled with the atleast one biasing element.

Example 52 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 51 to optionallyinclude wherein biasing the clamping surface and the at least one motortogether includes biasing at least one motor positioned around the stageplatform toward a first surface of the stage platform, and engaging thestage platform includes: engaging the at least one motor with the firstsurface, and engaging the clamping surface with a second surface of thestage platform opposed to the first surface.

Example 53 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 52 to optionallyinclude wherein engaging the stage platform includes engaging a rotationflange of the stage platform, the rotation flange includes the first andsecond opposed surfaces.

Example 54 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 53 to optionallyinclude wherein biasing the lamping surface and the at least one motortogether includes biasing at least two motors spaced around the stageplatform toward a first surface of the stage platform, and engaging thestage platform includes: engaging the at least two motors with the firstsurface, and engaging the clamping surface with a second surface of thestage platform opposed to the first surface.

Example 55 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 54 to optionallyinclude wherein engaging the stage platform includes engaging a tiltspindle of the stage platform, the tilt spindle includes: the firstsurface extending along an outer perimeter of the tilt spindle, and thesecond surface extending along an inner perimeter of the tilt spindle.

Example 56 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 55 to optionallyinclude wherein engaging the clamping surface with the second surface ofthe stage platform includes engaging an axle with the second surface ofthe tilt spindle.

Example 57 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1-56 to include, subjectmatter such as an apparatus, such as can include a sample stage surface;a plurality of linear stages coupled in series and coupled with thesample stage surface, each of the plurality of linear stages includes: astage base, a stage platform movably coupled with the stage base, and anactuator coupled with at least one of the stage base or stage platform,and the actuator is configured to move the stage platform relative tothe stage base along a linear axis; and at least one cross rollerbearing assembly interposed between the stage base and the stageplatform of at least one of the plurality of linear stages, wherein theat least one cross roller bearing assembly includes a plurality ofcylindrical bearings in an alternating crossed configuration, and eachof the plurality of cylindrical bearings includes a cylindrical bearingsurface engaged between opposed planar interface surfaces on the stageplatform and the stage base.

Example 58 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 57 to optionallyinclude wherein the plurality of linear stages includes three linearstages, and the linear axes of each of the stages are non-parallel,wherein: with a first force vector applied to the plurality of linearstages the cross roller bearing assemblies of at least two linear stagesof the three linear stages provide a first array of the opposed planarinterface surfaces on the respective stage platforms and the stage basesengaged with the cylindrical bearing surfaces interposed therebetween,and with a second force vector applied to the plurality of linear stagesthe cross roller bearing assemblies of at least two linear stages of thethree linear stages provide a second array of the opposed planarinterface surfaces on the respective stage platforms and the stage basesengaged with the cylindrical bearing surfaces interposed therebetween,wherein the second force vector is non-parallel to the first forcevector.

Example 59 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 58 to optionallyinclude wherein the at least one cross roller bearing assembly includes:a first rail channel in the stage base, a second rail channel in thestage platform, the second rail channel is opposed to and aligned withthe first rail channel, wherein the first and second rail channelsinclude a first pair of opposed interface surfaces, and the first andsecond rail channels include a second pair of opposed interfacesurfaces, the second pair of opposed interface surfaces at an angle tothe first pair of opposed interface surfaces, and the plurality ofcylindrical bearings are arranged in the first and second rail channelswith the cylindrical bearing surfaces in the alternating crossedconfiguration and engaged between the first and second pair of opposedinterface surfaces.

Example 60 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 59 to optionallyinclude wherein the first and second pairs of opposed interface surfacesare aligned with and extend parallel to the linear axis.

Example 61 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 60 to optionallyinclude wherein the first and second pair of opposed interface surfacesextend around the plurality of cylindrical bearings.

Example 62 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 61 to optionallyinclude wherein the at least one cross roller bearing assembly includesfirst and second cross roller bearing assemblies, and the actuator ispositioned between the first and second cross roller bearing assemblies.

Example 63 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 62 to optionallyinclude mechanical testing instrument coupled with a testing assemblyplatform, the testing assembly platform coupled with at least one of theplurality of linear stages, and the testing assembly platform isconfigured for coupling with a mounting stage of the multi-instrumentassembly.

Example 64 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 63 to optionallyinclude wherein two or more of the plurality of cylindrical bearings inthe alternating crossed configuration are engaged with each other alongadjacent cylindrical bearing surfaces, and the adjacent cylindricalbearing surfaces are orthogonal to each other.

Example 65 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 64 to optionallyinclude wherein each of the plurality of cylindrical bearings includesplanar end surfaces, the cylindrical bearing surfaces are interposedbetween the planar end surfaces, and a diameter of the planar endsurfaces is greater than a length of the cylindrical bearing surfaces.

Example 66 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 65 to optionallyinclude wherein the stage platform of one of linear stages of theplurality of linear stages includes the stage base of another of thelinear stages of the plurality of linear stages.

Example 67 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 66 to optionallyinclude wherein the actuator is fixed with one of the stage platform orthe stage base, and the actuator moves with the stage platform or thestage base the actuator is fixed to.

Example 68 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1-67 to include, subjectmatter such as a method, such as can include actuating one or morelinear stages of a plurality of linear stages coupled with a samplestage surface, the one or more linear stages each include a stageplatform movably coupled with a stage base along respective linear axes,and actuating includes moving at least one stage platform relative to atleast one stage base along the respective linear axis; actuating the oneor more linear stages includes aligning the sample stage surface withone or more instruments including a mechanical testing instrument; andconstraining lateral translation and tilting of the stage platformsrelative to the stage bases of the plurality of linear stages andrelative to the linear axes with cross roller bearing assembliesinterposed between one or more of the stage platforms and the stagebases, wherein the cross roller bearing assemblies include a pluralityof cylindrical bearings in an alternating crossed configuration.

Example 69 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 68 to optionallyinclude wherein constraining lateral translation and tilting includes:engaging platform planar interface surfaces of the stage platform withcylindrical bearing surfaces of the plurality of cylindrical bearings,and engaging base planar interface surfaces of the stage base with thecylindrical bearing surfaces of the plurality of cylindrical bearings.

Example 70 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 69 to optionallyinclude wherein constraining lateral translation and tilting includesengaging opposed pairs of platform and base planar interface surfaceswith cylindrical bearing surfaces of the plurality of cylindricalbearings with: a first array of cylindrical bearing surfaces engagedwith a first pair of the opposed pairs of platform and base planarinterface surfaces, and a second array of cylindrical bearing surfacesengaged with a second pair of the opposed pairs of platform and baseplanar interface surfaces, wherein the first pair of interface surfacesis at an angle to the second pair of interface surfaces corresponding tothe alternating crossed configuration of the cylindrical bearings.

Example 71 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 70 to optionallyinclude, wherein constraining lateral translation and tilting includesguiding the movement of at least one of the stage platforms relative toat least one of the respective stage bases along the respective linearaxis of one of the linear stages of the plurality of linear stages withone of the cross roller bearing assemblies.

Example 72 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 71 to optionallyinclude wherein aligning the sample stage surface with one or moreinstruments includes one or more of rotating or tilting the sample stagesurface with one or more of rotation or tilt stages coupled with theplurality of linear stages.

Example 73 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1-72 to include, subjectmatter such as a method, such as can include a modular instrumentassembly comprising: a stage including: a stage base, a stage mountmovably coupled with the stage base, the stage mount includes a stageinterface profile configured for coupling with one or more mechanicaltesting instruments, and one or more actuators coupled with the stagemount, the one or more actuators are configured to move the stage mountrelative to the stage base; and at least one mechanical testing assemblyconfigured for coupling with the stage, the at least one mechanicaltesting assembly including: a mechanical testing instrument, and aninstrument housing, wherein the instrument housing includes aninstrument interface profile complementary to the stage interfaceprofile, and the at least one mechanical testing assembly is removablycoupled with the stage mount when the instrument interface profile isengaged with the stage interface profile.

Example 74 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 73 to optionallyinclude one or more displacement sensors coupled between the stage baseand the stage mount, wherein the one or more displacement sensors areconfigured to measure the displacement of the stage mount.

Example 75 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 74 to optionallyinclude wherein the at least one mechanical testing assembly includesfirst and second mechanical testing assemblies and: the first mechanicaltesting assembly includes a first mechanical testing instrument and afirst instrument interface profile complementary to the stage interfaceprofile, and the second mechanical testing assembly includes a secondmechanical testing instrument and a second instrument interface profilecomplementary to the stage interface profile.

Example 76 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 75 to optionallyinclude a linear stage coupled with the flexural stage, the linear stageis configured to move the flexural stage and the at least one mechanicaltesting assembly.

Example 77 can include, or can optionally be combined with the subjectmatter of one or any combination of Examples 1 through 76 to optionallyinclude wherein the flexural stage includes one or more springs coupledbetween the stage base and the stage mount, the one or more stringsconstrain movement of the stage mount to a uniaxial direction.

Each of these non-limiting examples can stand on its own, or can becombined in any permutation or combination with any one or more of theother examples.

The above detailed description includes references to the accompanyingdrawings, which form a part of the detailed description. The drawingsshow, by way of illustration, specific embodiments in which theinvention can be practiced. These embodiments are also referred toherein as “examples.” Such examples can include elements in addition tothose shown or described. However, the inventors also contemplateexamples in which only those elements shown or described are provided.Moreover, the inventors also contemplate examples using any combinationor permutation of those elements shown or described (or one or moreaspects thereof), either with respect to a particular example (or one ormore aspects thereof), or with respect to other examples (or one or moreaspects thereof) shown or described herein.

In the event of inconsistent usages between this document any documentsso incorporated by reference, the usage in this document controls.

In this document, the terms “a” or “an” are used, as is common in patentdocuments, to include one or more than one, independent of any otherinstances or usages of “at least one” or “one or more.” In thisdocument, the term “or” is used to refer to a nonexclusive or, such that“A or B” includes “A but not B,” “B but not A,” and “A and B,” unlessotherwise indicated. In this document, the terms “including” and “inwhich” are used as the plain-English equivalents of the respective terms“comprising” and “wherein.” Also, in the following claims, the terms“including” and “comprising” are open-ended, that is, a system, device,article, composition, formulation, or process that includes elements inaddition to those listed after such a term in a claim are still deemedto fall within the scope of that claim. Moreover, in the followingclaims, the terms “first,” “second,” and “third,” etc. are used merelyas labels, and are not intended to impose numerical requirements ontheir objects.

Method examples described herein can be machine or computer-implementedat least in part. Some examples can include a computer-readable mediumor machine-readable medium encoded with instructions operable toconfigure an electronic device to perform methods as described in theabove examples. An implementation of such methods can include code, suchas microcode, assembly language code, a higher-level language code, orthe like. Such code can include computer readable instructions forperforming various methods. The code may form portions of computerprogram products. Further, in an example, the code can be tangiblystored on one or more volatile, non-transitory, or non-volatile tangiblecomputer-readable media, such as during execution or at other times.Examples of these tangible computer-readable media can include, but arenot limited to, hard disks, removable magnetic disks, removable opticaldisks (e.g., compact disks and digital video disks), magnetic cassettes,memory cards or sticks, random access memories (RAMs), read onlymemories (ROMs), and the like.

The above description is intended to be illustrative, and notrestrictive. For example, the above-described examples (or one or moreaspects thereof) may be used in combination with each other. Otherembodiments can be used, such as by one of ordinary skill in the artupon reviewing the above description. The Abstract is provided to complywith 37 C.F.R. § 1.72(b), to allow the reader to quickly ascertain thenature of the technical disclosure. It is submitted with theunderstanding that it will not be used to interpret or limit the scopeor meaning of the claims. Also, in the above Detailed Description,various features may be grouped together to streamline the disclosure.This should not be interpreted as intending that an unclaimed disclosedfeature is essential to any claim. Rather, inventive subject matter maylie in less than all features of a particular disclosed embodiment.Thus, the following claims are hereby incorporated into the DetailedDescription, with each claim standing on its own as a separateembodiment, and it is contemplated that such embodiments can be combinedwith each other in various combinations or permutations. The scope ofthe invention should be determined with reference to the appendedclaims, along with the full scope of equivalents to which such claimsare entitled.

The claimed invention is:
 1. A testing assembly configured for enclosureand operation within a chamber of an instrument assembly, the testingassembly comprising: a mechanical testing instrument configured toconduct mechanical testing on a sample, the mechanical testinginstrument includes: a movable probe including a probe tip, and atransducer coupled with the movable probe; a multiple degree of freedomsample stage including: a sample stage surface configured for receptionof the sample, at least one linear stage, at least one of a rotationstage or a tilt stage coupled with the one or more linear stages, andwherein at least two of the linear stage, the rotation stage or the tiltstage are configured to orient the sample stage surface relative to theprobe tip into at least first and second orientations, and each of thefirst and second orientations are different and the sample stage surfaceis proximate the probe tip in each of the first and second orientations;and a testing assembly platform, wherein each of the mechanical testinginstrument and the multiple degree of freedom stage are mounted to thetesting assembly platform, and the testing assembly platform isconfigured to support the mechanical testing instrument and the multipledegree of freedom stage in a location away from walls of the chamber. 2.The testing assembly of claim 1, wherein the multiple degree of freedomsample stage includes the rotation stage and the tilt stage.
 3. Thetesting assembly of claim 2 comprising a rotation and tilt assemblyincluding the rotation and tilt stages, the rotation and tilt assemblyincludes: a rotation stage base coupled with the at least one linearstage, a rotation stage platform movably coupled with the rotation stagebase, a tilt stage base coupled with the rotation stage platform, and atilt stage platform movably coupled with the tilt stage base.
 4. Thetesting assembly of claim 1, wherein the at least one linear stageincludes a plurality of linear stages, and the at least one rotation ortilt stage is interposed between the linear stages of the plurality oflinear stages.
 5. The testing assembly of claim 1, wherein: in the firstorientation, the sample stage surface is facing the probe tip and withina working region of a first instrument, and in the second orientation,the sample stage surface is within a working region of a secondinstrument different than the first instrument.
 6. The testing assemblyof claim 5, wherein at least two of the linear stage, the rotation stageor the tilt stage are configured to orient the sample stage surfacerelative to the probe tip into a third orientation, and the thirdorientation is different than the first and second orientations, andwherein in the third orientation, the sample stage surface is within athird working region of a third instrument that is different than thefirst instrument and the second instrument.
 7. The testing assembly ofclaim 1, wherein the at least one linear stage includes a plurality oflinear stages, and the at least one rotation or tilt stage is interposedbetween the linear stages of the plurality of linear stages or betweenthe testing assembly platform and the plurality of linear stages.
 8. Thetesting assembly of claim 1, wherein at least two of the linear stagethe rotation stage or the tilt stage is configured to orient the samplestage surface relative to the probe tip and an instrument of theinstrument assembly.
 9. The testing assembly of claim 1, comprising alinear stage actuator coupled with the mechanical testing instrument,and the linear stage actuator is configured to move the mechanicaltesting instrument relative to the multiple degree of freedom samplestage.
 10. The testing assembly of claim 1 comprising the instrumentassembly, the instrument assembly includes: the chamber including wallsenclosing the chamber, a plurality of instruments clustered in proximityto the sample stage surface, and a mounting stage within the chamber,and the mechanical testing instrument and the multiple degree of freedomsample stage assembly are coupled with the mounting stage.
 11. Thetesting assembly of claim 1, wherein each of the first and secondorientations include one or more of translational, rotational or tiltingpositions: in the first orientation the sample stage surface is alignedwith the probe tip and proximate to the probe tip, and the sample stagesurface is at a first translational position and one or more of a firstrotational position or a first tilting position, and in the secondorientation the sample stage surface is aligned with the probe tip andproximate to the probe tip, and the sample stage surface is at a secondtranslational position and one or more of a second rotational positionor a second tilting position different from the respective firsttranslational position and the one or more first rotational position orthe first tilting position.
 12. The testing assembly of claim 1, whereinthe first orientation is orthogonal to the second orientation.
 13. Atesting assembly configured for enclosure and operation within a chamberof an instrument assembly, the testing assembly comprising: a mechanicaltesting instrument configured to conduct testing on a sample with aprobe tip; a multiple degree of freedom sample stage including a samplestage surface, and the sample stage surface is configured forpositioning in at least first and second orientations: in the firstorientation the sample stage surface is proximate to the probe tip andwithin a first working region of a first instrument, and the samplestage surface is at a first translational position and one or more of afirst rotational position or a first tilting position, and in the secondorientation the sample stage surface is within a second working regionof a second instrument different than the first instrument, wherein thefirst working region is different than the second working region, andthe sample stage surface is at a second translational position and oneor more of a second rotational position or a second tilting positiondifferent from the respective one or more first rotational position orfirst tilting position; wherein the multiple degree of freedom samplestage includes at least one linear stage coupled with the sample stagesurface and one or more of: a rotation stage coupled with the samplestage surface, or a tilt stage coupled with the sample stage surface,and the sample stage surface is positioned in the first and secondorientations according to movement of one or more of the rotation stageor the tilt stage; and a testing assembly platform, wherein each of themechanical testing instrument and the multiple degree of freedom stageare mounted to the testing assembly platform, and the testing assemblyplatform is configured to support the mechanical testing instrument andthe multiple degree of freedom stage in a location away from walls ofthe chamber.
 14. The testing assembly of claim 13, wherein the sample:stage surface is positioned in the first and second orientationsaccording to movement of the at least one linear stage and one or moreof the rotation stage or the tilt stage.
 15. The testing assembly ofclaim 13 comprising a testing assembly platform, and each of themechanical testing instrument and the multiple degree of freedom stageare mounted to the testing assembly platform.
 16. The testing assemblyof claim 13, wherein at least two of the linear stage, the rotationstage or the tilt stage is configured to orient the sample stage surfacerelative to the probe tip into a third orientation, and the thirdorientation is different than the first and second orientations, andwherein in the third orientation the sample stage surface is within athird working region of a third instrument that is different than thefirst instrument and the second instrument.
 17. The testing assembly ofclaim 13, wherein one of the rotation stage or the tilt stage isdirectly coupled with the sample stage surface, and the at least onelinear stage is directly coupled with one of the rotation stage or thetilt stage.
 18. The testing assembly of claim 13, wherein the at leastone linear stage includes a plurality of linear stages, and the rotationstage or the tilt stage is interposed between linear stages of theplurality of linear stages.
 19. The testing assembly of claim 13,wherein the multiple degree of freedom sample stage includes therotation stage and the tilt stage.
 20. The testing assembly of claim 19comprising a rotation and tilt assembly including the rotation and tiltstages, the rotation and tilt assembly includes: a rotation stage basecoupled with the at least one linear stage, a rotation stage platformmovably coupled with the rotation stage base, a tilt stage base coupledwith the rotation stage platform, and a tilt stage platform movablycoupled with the tilt stage base.
 21. The testing assembly of claim 13,wherein the first orientation is orthogonal to the second orientation.22. A testing assembly configured for enclosure and operation within achamber of an instrument assembly, the testing assembly comprising: amechanical testing instrument configured to conduct mechanical testingon a sample, the mechanical testing instrument includes: a movable probeincluding a probe tip, and a transducer coupled with the movable probe;at least one linear stage coupled with the mechanical testinginstrument; a multiple degree of freedom sample stage including: asample stage surface configured for reception of the sample, at leastone of a rotation stage or a tilt stage coupled with the sample stagesurface; wherein at least one of the linear stage coupled with themechanical testing instrument, the rotation stage, or the tilt stagecoupled with the sample stage surface are configured to orient at leastone of the sample stage surface or the probe tip relative to the otherof the probe tip or the sample stage surface into at least first andsecond orientations, and each of the first and second orientations aredifferent and the sample stage surface is proximate the probe tip ineach of the first and second orientations, and wherein: in the firstorientation, the sample stage surface is facing the probe tip and withina first working region of a first instrument, and in the secondorientation, the sample stage surface is within a second working regionof a second instrument different than the first working region; and atesting assembly platform interconnecting each of the mechanical testinginstrument and the multiple degree of freedom stage, the testingassembly platform configured to separate each of the mechanical testinginstrument and the multiple degree of freedom stage from walls of thechamber, wherein each of the mechanical testing instrument and themultiple degree of freedom stage are mounted to the testing assemblyplatform, and the testing assembly platform is configured to support themechanical testing instrument without creating a mechanical loop thatextends through walk of the chamber.
 23. The testing assembly of claim22, wherein the at least one linear stage coupled with the mechanicaltesting instrument includes a plurality of linear stages.
 24. Thetesting assembly of claim 22, wherein the multiple degree of freedomsample stage includes one or more linear stages coupled with the samplestage surface, the one or more linear stages different from the at leastone linear stage coupled with the mechanical-testing instrument.
 25. Thetesting assembly of claim 22, wherein the multiple degree of freedomsample stage includes the rotation stage and the tilt stage.
 26. Thetesting assembly of claim 25 comprising a rotation and tilt assemblyincluding the rotation and tilt stages, the rotation and tilt assemblyincludes: a rotation stage base coupled with the at least one linearstage, a rotation stage platform movably coupled with the rotation stagebase, a tilt stage base coupled with the rotation stage platform, and atilt stage platform movably coupled with the tilt stage base.
 27. Thetesting assembly of claim 22 comprising a testing assembly platform, andeach of the mechanical testing instrument, the at least one linear stageand the multiple degree of freedom stage are mounted to the testingassembly platform.
 28. The testing assembly of claim 22, wherein atleast two of the linear stage, the rotation stage or the tilt stage isconfigured to orient the sample stage surface relative to the probe tipinto a third orientation, and the third orientation is different thanthe first and second orientations, and wherein in the third orientationthe sample stage surface is within a third working region of a thirdinstrument that is different than the first instrument and the secondinstrument.
 29. The testing assembly of claim 22 comprising theinstrument assembly, the instrument assembly includes: the chamberincluding walls enclosing the chamber, a plurality of instrumentsclustered in proximity to the sample stage surface, and a mounting stagewithin the chamber, and the mechanical testing instrument, the at leastone linear stage and the multiple degree of freedom sample stageassembly are coupled with the mounting stage.
 30. A method of using atesting assembly enclosed within a chamber of an instrument assembly,the method comprising: conducting testing of a sample on a sample stagesurface with a first instrument, the sample stage surface in a firstorientation within a first working region of a first instrument;orienting the sample stage surface including the sample into a secondorientation different than the first orientation and within a secondworking region of a second instrument that is different than the firstworking region of the first instrument, orienting into the secondorientation includes: translating the sample stage surface relative tothe first orientation with at least one linear stage of a multipledegree of freedom sample stage, and one or more of rotating or tiltingthe sample stage surface relative to the first orientation with one ormore of a rotation stage or a tilt stage of the multiple degree offreedom sample stage; conducting mechanical testing of the sample in oneor more of the first orientation or the second orientation with themechanical testing instrument; and wherein each of the mechanicaltesting instrument and the multiple degree of freedom stage are mountedto a testing assembly platform, and the testing assembly platform isconfigured to support the mechanical testing instrument and the multipledegree of freedom stage in a location away from walls of the chamber.31. The method of claim 30 comprising: orienting the sample stagesurface including the sample into a third orientation relative to asecond instrument, orienting into the third orientation includes one ormore of: translating the sample stage surface with the at least onelinear stage of the multiple degree of freedom sample stage, or one ormore of rotating or tilting the sample stage surface with one or more ofthe rotation stage or the tilt stage, respectively; and conductingtesting of the sample in the third orientation with the secondinstrument.
 32. The method of claim 31, wherein the third orientation isidentical to the first orientation and the second instrument isidentical to the instrument, and conducting testing of the sample in thethird orientation including conducting testing of the sample in thefirst orientation with the instrument.
 33. The method of claim 30,wherein conducting testing of the sample in the second orientation withthe mechanical deformation based testing instrument is before conductingthe test of the sample in the first orientation with the instrument. 34.The method of claim 30, wherein orienting into the second orientationincludes rotating and tilting the sample stage surface with the rotationstage and the tilt stage, respectively.
 35. The method of claim 30,wherein orienting the sample stage surface includes orienting the samplestage surface within a plurality of instruments clustered proximate tothe sample stage surface.
 36. The method of claim 30, wherein orientingthe sample stage surface includes orienting the sample stage surfacewithin a plurality of instruments clustered proximately around thesample stage surface.
 37. The method claim 30, orienting the samplestage surface relative to the probe tip into a third orientation, andthe third orientation is different than the first and secondorientations, and wherein in the third orientation, the sample stagesurface is facing the probe tip and within a third working region of athird instrument that is different than the first instrument and thesecond instrument.